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Journal: Appl. Sci., 2021
Volume: 11
Number: 12062

Article: Improved Training of CAE-Based Defect Detectors Using Structural Noise
Authors: by Reina Murakami, Valentin Grave, Osamu Fukuda, Hiroshi Okumura and Nobuhiko Yamaguchi
Link: https://www.mdpi.com/2076-3417/11/24/12062

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