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Journal: Appl. Sci., 2022
Volume: 12
Number: 176

Article: The SXFEL Upgrade: From Test Facility to User Facility
Authors: by Bo Liu, Chao Feng, Duan Gu, Fei Gao, Haixiao Deng, Meng Zhang, Sen Sun, Si Chen, Wei Zhang, Wencheng Fang, Zhen Wang, Qiaogen Zhou, Yongbin Leng, Ming Gu, Lixin Yin, Qiang Gu, Guoping Fang, Dong Wang and Zhentang Zhao
Link: https://www.mdpi.com/2076-3417/12/1/176

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