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Special Issue on Design of Fault-Tolerant Digital Circuits and Systems
 
 

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Journal: Appl. Sci., 2022
Volume: 12
Number: 11500

Article: Design of Static Random-Access Memory Cell for Fault Tolerant Digital System
Authors: by Taehwan Yoon, Jihwan Park and Hanwool Jeong
Link: https://www.mdpi.com/2076-3417/12/22/11500

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