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Journal: Appl. Sci., 2022
Volume: 12
Number: 4229

Article: Efficacy of Transistor Interleaving in DICE Flip-Flops at a 22 nm FD SOI Technology Node
Authors: by Christopher J. Elash, Zongru Li, Chen Jin, Li Chen, Jiesi Xing, Zhiwu Yang and Shuting Shi
Link: https://www.mdpi.com/2076-3417/12/9/4229

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