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Journal: Applied SciencesVolume: 12Number: 4679
Article: Improved U-Net++ with Patch Split for Micro-Defect Inspection in Silk Screen Printing
  • Authors:
  • Byungguan Yoon1,
  • Homin Lee2 and
  • Jongpil Jeong1,*
Link: https://www.mdpi.com/2076-3417/12/9/4679

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