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Journal: Appl. Sci., 2024
Volume: 14
Number: 7493
Article:
Yolo Based Defects Detection Algorithm for EL in PV Modules with Focal and Efficient IoU Loss
Authors:
by
Shen Ding, Wanting Jing, Hao Chen and Congyan Chen
Link:
https://www.mdpi.com/2076-3417/14/17/7493
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