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Review

Atomic Force Spectroscopy on Ionic Liquids

by
Christian Rodenbücher
*,
Klaus Wippermann
and
Carsten Korte
Forschungszentrum Jülich GmbH, Institute of Energy and Climate Research (IEK-3), 52425 Jülich, Germany
*
Author to whom correspondence should be addressed.
Appl. Sci. 2019, 9(11), 2207; https://doi.org/10.3390/app9112207
Submission received: 30 April 2019 / Revised: 23 May 2019 / Accepted: 24 May 2019 / Published: 29 May 2019
(This article belongs to the Section Chemical and Molecular Sciences)

Abstract

Ionic liquids have become of significant relevance in chemistry, as they can serve as environmentally-friendly solvents, electrolytes, and lubricants with bespoke properties. In particular for electrochemical applications, an understanding of the interface structure between the ionic liquid and an electrified interface is needed to model and optimize the reactions taking place on the solid surface. As with ionic liquids, the interplay between electrostatic forces and steric effects leads to an intrinsic heterogeneity, as the structure of the ionic liquid above an electrified interface cannot be described by the classical electrical double layer model. Instead, a layered solvation layer is present with a structure that depends on the material combination of the ionic liquid and substrate. In order to experimentally monitor this structure, atomic force spectroscopy (AFS) has become the method of choice. By measuring the force acting on a sharp microfabricated tip while approaching the surface in an ionic liquid, it has become possible to map the solvation layers with sub-nanometer resolution. In this review, we provide an overview of the AFS studies on ionic liquids published in recent years that illustrate how the interface is formed and how it can be modified by applying electrical potential or by adding impurities and solvents.
Keywords: ionic liquids; solid/liquid interface; atomic force microscopy; electric double layer ionic liquids; solid/liquid interface; atomic force microscopy; electric double layer

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MDPI and ACS Style

Rodenbücher, C.; Wippermann, K.; Korte, C. Atomic Force Spectroscopy on Ionic Liquids. Appl. Sci. 2019, 9, 2207. https://doi.org/10.3390/app9112207

AMA Style

Rodenbücher C, Wippermann K, Korte C. Atomic Force Spectroscopy on Ionic Liquids. Applied Sciences. 2019; 9(11):2207. https://doi.org/10.3390/app9112207

Chicago/Turabian Style

Rodenbücher, Christian, Klaus Wippermann, and Carsten Korte. 2019. "Atomic Force Spectroscopy on Ionic Liquids" Applied Sciences 9, no. 11: 2207. https://doi.org/10.3390/app9112207

APA Style

Rodenbücher, C., Wippermann, K., & Korte, C. (2019). Atomic Force Spectroscopy on Ionic Liquids. Applied Sciences, 9(11), 2207. https://doi.org/10.3390/app9112207

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