Xing, Z.; Zhang, C.; Cui, H.; Hai, Y.; Wu, Q.; Min, D.
Space Charge Accumulation and Decay in Dielectric Materials with Dual Discrete Traps. Appl. Sci. 2019, 9, 4253.
https://doi.org/10.3390/app9204253
AMA Style
Xing Z, Zhang C, Cui H, Hai Y, Wu Q, Min D.
Space Charge Accumulation and Decay in Dielectric Materials with Dual Discrete Traps. Applied Sciences. 2019; 9(20):4253.
https://doi.org/10.3390/app9204253
Chicago/Turabian Style
Xing, Zhaoliang, Chong Zhang, Haozhe Cui, Yali Hai, Qingzhou Wu, and Daomin Min.
2019. "Space Charge Accumulation and Decay in Dielectric Materials with Dual Discrete Traps" Applied Sciences 9, no. 20: 4253.
https://doi.org/10.3390/app9204253
APA Style
Xing, Z., Zhang, C., Cui, H., Hai, Y., Wu, Q., & Min, D.
(2019). Space Charge Accumulation and Decay in Dielectric Materials with Dual Discrete Traps. Applied Sciences, 9(20), 4253.
https://doi.org/10.3390/app9204253