Structural and Mechanical Properties of Fluorine-Containing TaCxNy Thin Films Deposited by Reactive Magnetron Sputtering
Abstract
:1. Introduction
2. Materials and Methods
2.1. Deposition
2.2. Thin Film Characterization
3. Results and discussion
3.1. Structural Analysis
3.2. Chemical Composition and Bond Analysis
3.3. Mechanical Properties
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Process Parameters | |
---|---|
Power of Ta target (W) | (DC) 190 |
RF Bias (W) | (RF) 50 |
Target–substrate distance (cm) | 10 |
Background pressure (torr) | 4 × 10−6 |
Flow Rate of Ar (sccm) | 35 |
Flow Rate of N2 (sccm) | 4.5 |
Flow Rate of C2F6 (sccm) | 0/1/2/3/4 |
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Hsieh, J.-H.; Li, C.; Wu, W.; Liu, S.-L. Structural and Mechanical Properties of Fluorine-Containing TaCxNy Thin Films Deposited by Reactive Magnetron Sputtering. Coatings 2022, 12, 508. https://doi.org/10.3390/coatings12040508
Hsieh J-H, Li C, Wu W, Liu S-L. Structural and Mechanical Properties of Fluorine-Containing TaCxNy Thin Films Deposited by Reactive Magnetron Sputtering. Coatings. 2022; 12(4):508. https://doi.org/10.3390/coatings12040508
Chicago/Turabian StyleHsieh, Jang-Hsing, Chuan Li, Weite Wu, and Shan-Lun Liu. 2022. "Structural and Mechanical Properties of Fluorine-Containing TaCxNy Thin Films Deposited by Reactive Magnetron Sputtering" Coatings 12, no. 4: 508. https://doi.org/10.3390/coatings12040508
APA StyleHsieh, J. -H., Li, C., Wu, W., & Liu, S. -L. (2022). Structural and Mechanical Properties of Fluorine-Containing TaCxNy Thin Films Deposited by Reactive Magnetron Sputtering. Coatings, 12(4), 508. https://doi.org/10.3390/coatings12040508