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Fern C-L, Liu W-J, Chang Y-H, Chiang C-C, Lai J-X, Chen Y-T, Chen W-G, Wu T-H, Lin S-H, Lin K-W. Studying the Crucial Physical Characteristics Related to Surface Roughness and Magnetic Domain Structure in CoFeSm Thin Films. Coatings. 2023; 13(11):1961. https://doi.org/10.3390/coatings13111961

Fern, Chi-Lon, Wen-Jen Liu, Yung-Huang Chang, Chia-Chin Chiang, Jian-Xin Lai, Yuan-Tsung Chen, Wei-Guan Chen, Te-Ho Wu, Shih-Hung Lin, and Ko-Wei Lin. 2023. "Studying the Crucial Physical Characteristics Related to Surface Roughness and Magnetic Domain Structure in CoFeSm Thin Films" Coatings 13, no. 11: 1961. https://doi.org/10.3390/coatings13111961

Fern, C. -L., Liu, W. -J., Chang, Y. -H., Chiang, C. -C., Lai, J. -X., Chen, Y. -T., Chen, W. -G., Wu, T. -H., Lin, S. -H., & Lin, K. -W. (2023). Studying the Crucial Physical Characteristics Related to Surface Roughness and Magnetic Domain Structure in CoFeSm Thin Films. Coatings, 13(11), 1961. https://doi.org/10.3390/coatings13111961