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Journal: Electronics, 2021
Volume: 10
Number: 2515
Article:
High-Performance Double-Node-Upset-Tolerant and Triple-Node-Upset-Tolerant Latch Designs
Authors:
by
Hui Xu, Le Zhou, Huaguo Liang, Zhengfeng Huang, Cong Sun and Yafei Ning
Link:
https://www.mdpi.com/2079-9292/10/20/2515
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