Cui, T.; Zhu, L.; Chen, D.; Fan, Y.; Liu, J.; Li, X.
Independent Effects of Dopant, Oxygen Vacancy, and Specific Surface Area on Crystal Phase of HfO2 Thin Films towards General Parameters to Engineer the Ferroelectricity. Electronics 2022, 11, 2369.
https://doi.org/10.3390/electronics11152369
AMA Style
Cui T, Zhu L, Chen D, Fan Y, Liu J, Li X.
Independent Effects of Dopant, Oxygen Vacancy, and Specific Surface Area on Crystal Phase of HfO2 Thin Films towards General Parameters to Engineer the Ferroelectricity. Electronics. 2022; 11(15):2369.
https://doi.org/10.3390/electronics11152369
Chicago/Turabian Style
Cui, Tianning, Liping Zhu, Danyang Chen, Yuyan Fan, Jingquan Liu, and Xiuyan Li.
2022. "Independent Effects of Dopant, Oxygen Vacancy, and Specific Surface Area on Crystal Phase of HfO2 Thin Films towards General Parameters to Engineer the Ferroelectricity" Electronics 11, no. 15: 2369.
https://doi.org/10.3390/electronics11152369
APA Style
Cui, T., Zhu, L., Chen, D., Fan, Y., Liu, J., & Li, X.
(2022). Independent Effects of Dopant, Oxygen Vacancy, and Specific Surface Area on Crystal Phase of HfO2 Thin Films towards General Parameters to Engineer the Ferroelectricity. Electronics, 11(15), 2369.
https://doi.org/10.3390/electronics11152369