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Journal: Electronics, 2023
Volume: 12
Number: 2833

Article: Heavy Ion Single Event Effects in CMOS Image Sensors: SET and SEU
Authors: by Zhikang Yang, Lin Wen, Yudong Li, Jie Feng, Dong Zhou, Bingkai Liu, Zitao Zhao and Qi Guo
Link: https://www.mdpi.com/2079-9292/12/13/2833

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