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Journal: Electronics, 2023
Volume: 12
Number: 3331

Article: Design and Validation of a V-Gate n-MOSFET-Based RH CMOS Logic Circuit with Tolerance to the TID Effect
Authors: by Donghan Ki, Minwoong Lee, Namho Lee and Seongik Cho
Link: https://www.mdpi.com/2079-9292/12/15/3331

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