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Journal: Electronics, 2023
Volume: 12
Number: 1667

Article: Recess-Free E-Mode AlGaN/GaN MIS-HFET with Crystalline PEALD AlN Passivation Process
Authors: by Won-Ho Jang, Jun-Hyeok Yim, Hyungtak Kim and Ho-Young Cha
Link: https://www.mdpi.com/2079-9292/12/7/1667

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