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Journal: Electronics, 2025
Volume: 14
Number: 1296

Article: Radiation-Hardened Design and Experimental Validation Using a Mixed-Stage Model for Reliability Assessment of Integrated Circuits in Radiation Environments
Authors: by Minwoong Lee, Namho Lee, Donghan Ki and Seongik Cho
Link: https://www.mdpi.com/2079-9292/14/7/1296

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