SuperNANO: Enabling Nanoscale Laser Anti-Counterfeiting Marking and Precision Cutting with Super-Resolution Imaging
Abstract
:1. Introduction
2. SuperNANO System Design
2.1. SuperNANO System Setup
2.2. Fabrication of USO
2.3. Muti-Level Laser Security Marking
3. Results and Discussion
3.1. NiM Strategy Marking
3.2. NPM Strategy Marking
3.3. Nanowire Cutting
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Chen, Y.; Yan, B.; Yue, L.; Jones, C.L.; Wang, Z. SuperNANO: Enabling Nanoscale Laser Anti-Counterfeiting Marking and Precision Cutting with Super-Resolution Imaging. Photonics 2024, 11, 846. https://doi.org/10.3390/photonics11090846
Chen Y, Yan B, Yue L, Jones CL, Wang Z. SuperNANO: Enabling Nanoscale Laser Anti-Counterfeiting Marking and Precision Cutting with Super-Resolution Imaging. Photonics. 2024; 11(9):846. https://doi.org/10.3390/photonics11090846
Chicago/Turabian StyleChen, Yiduo, Bing Yan, Liyang Yue, Charlotte L. Jones, and Zengbo Wang. 2024. "SuperNANO: Enabling Nanoscale Laser Anti-Counterfeiting Marking and Precision Cutting with Super-Resolution Imaging" Photonics 11, no. 9: 846. https://doi.org/10.3390/photonics11090846