- Article
ImbDef-GAN: Defect Image-Generation Method Based on Sample Imbalance
- Dengbiao Jiang,
- Nian Tao,
- Kelong Zhu,
- Yiming Wang and
- Haijian Shao
In industrial settings, defect detection using deep learning typically requires large numbers of defective samples. However, defective products are rare on production lines, creating a scarcity of defect samples and an overabundance of samples that c...