A Novel Fractal Model for Contact Resistance Based on Axisymmetric Sinusoidal Asperity
, Shihao Yang 1,2, Weikun Wang 3, Shuai Wang 4, Qi An 1,2,*, Min Huang 1,2,* and Shuangfu Suo 5Round 1
Reviewer 1 Report
Comments and Suggestions for AuthorsThe paper is on modeling contact resistance by introducing a fractal model, using an axisymmetric sinusoidal asperity. By incorporating three-dimensional fractal theory, the authors claim that their model can more precisely characterize the micro-morphology of rough interfaces and therefore provide a more accurate prediction of contact resistance. The study combines theoretical analysis, numerical simulation, and experimental validation. The content is well-structured and provides a solid basis for future research in this field.
- In Fig. 6 a), c), and e), the same range of Rc* (0…10x10^-2) should be used for visual comparability. The same should be applied to Figs. 7 and 8.
- Please check, if one of the two words “factor” in the sentence below Eq. 17 is redundant.
Author Response
We thank the reviewers for his careful read and thoughtful comments on the previous manuscript. We have carefully taken his comments into consideration in preparing our revision, which has resulted in a paper that is clearer, more compelling, and broader. The following summarizes how we responded to the reviewer comments.
The detailed responses can be found in the uploaded file.
Author Response File: 
Author Response.pdf
Reviewer 2 Report
Comments and Suggestions for Authors The manuscript a multi-asperity model to predict the contact resistance of a rough surface descripted by axisymmetric sinusoidal asperities. The study is very similar to previous studies part of the authors (refs [35-37]). In general, while the focus of the present study is to investigate the effect of the exact shape of the asperity, the well-known main limitation of multi-asperity theories is to the neglect of the interaction between asperities in rough interfaces. As a consequence, I would suggest the authors to comment on this, also referring to the contact mechanics comparisons provided in [DOI: 10.1007/s11249-017-0900-2] against more recent contact theories. They should also critically comment on other mean-field (fractal) theories (see Persson’s one in DOI: 10.1007/s11249-022-01630-2) for rough contact resistance and on specific numerical calculations devoted to interfacial conductivities (see DOI: 10.1016/j.xcrp.2023.101328). In conclusion, the manuscript requires minor revision before being accepted.
Author Response
We thank the reviewers for his careful read and thoughtful comments on the previous manuscript. We have carefully taken his comments into consideration in preparing our revision, which has resulted in a paper that is clearer, more compelling, and broader. The following summarizes how we responded to the reviewer comments.
The detailed responses can be found in the uploaded file.
Author Response File: Author Response.pdf
