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Fault Detection and State Estimation in Automatic Control
This special issue belongs to the section “Robotics and Automation“.
Special Issue Information
Dear Colleagues,
With level science and technology, the modern industrial production scale degree, modern scale, complexity, and degree of automation of the control system are greatly improved. Additionally, state estimation and fault detection are particularly important in the process of production if they can be achieved before the fault causes damage to the system; further, testing and maintenance can reduce the risk of accidents, improve system security, and reduce the economic loss of production. Therefore, the purpose of this Special Issue is to introduce the latest fault detection algorithms and state estimation methods.
This Special Issue aims to focus on intelligent control, intelligent modeling, computational intelligence, artificial intelligence, machine learning, and fault detection. This fits the scope of Applied Sciences as the practical applications of fault detection and machine learning are incredibly extensive and important.
In this Special Issue, original research articles and reviews are welcome. Research areas may include (but are not limited to) the following:
- Design and application of fault detection algorithms;
- Design and application of state estimation methods;
- Design and application of machine learning algorithms;
- Automatic control system characteristics analysis;
- Design and application of intelligent control systems.
We look forward to receiving your contributions.
Prof. Dr. Sheng Du
Dr. Wei Wang
Dr. Hao Fu
Prof. Dr. Xiongbo Wan
Guest Editors
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- intelligent control
- intelligent modeling
- computational intelligence
- artificial intelligence
- machine learning
- fault detection
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