Advanced Optical Measurement Techniques and Applications

Dear Colleagues,

Optical measurement techniques have played a crucial role in the study of the interactions between light and materials across various fields, including physics, chemistry, biology, medicine, astronomy, etc.

This Special Issue, titled “Advanced Optical Measurement Techniques and Applications”, will explore a range of advanced optical technologies pertinent to scientific, chemical, biomedical, and environmental applications. It will provide a comprehensive overview of current trends, challenges, and future directions in these rapidly evolving fields. Various optical sensing technologies including spectroscopy and microscopy facilitate the detection of gases like CO₂, NH₃ and H₂O, as well as proteins and biological tissues. These technologies employ diverse optical sources including optical comb sources, superluminescent light emitting diodes, supercontinuum sources, and short pulse laser sources. Thanks to advances in machine learning and computational algorithms, the performances of these techniques have been significantly enhanced, allowing for compact, non-contact, rapid and accurate measurement. Moreover, optical materials such as metamaterials, metasurfaces and photonics crystals are greatly useful to these applications.

This Special Issue seeks contributions that address theoretical, experimental and applied research in academic and industrial contexts. The technical developments in optical measurement, including hardware, algorithms and devices, will serve as valuable references and educational resources for graduate students and researchers in engineering, physics, photonics and computer science who are interested in these fields.

Research areas may include, but are not limited to, the following:

- Computational spectroscopy;

- Raman spectroscopy;

- Infrared spectroscopy;

- Fourier transform spectrometry;

- Ptychography/Fourier ptychography;

- Computational microscopy;

- Digital holographic microscopy;

- Laser-induced breakdown spectroscopy;

- Chip-based optical sensing;

- Computational optical sensing techniques;

- Hyperspectral imaging;

- Coherent sources for sensing;

- Incoherent sources for sensing;

- Machine learning for super-resolution;

- Machine learning for computational imaging;

- Optical materials including metamaterials, metasurfaces and photonics crystals for imaging and sensing;

- Biomedical applications;

- Environmental applications;

- Point-of-care applications;

- Applications to food and chemical analysis.

Prof. Dr. Won Kweon Jang
Guest Editor

Dr. Ju Yong Cho
Guest Editor Assistant

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 250 words) can be sent to the Editorial Office for assessment.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.