Advanced Technologies for Testing, Diagnosis and Prognosis in Electronic Systems and Devices
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Electrical, Electronics and Communications Engineering".
Deadline for manuscript submissions: 20 February 2025 | Viewed by 636
Special Issue Editors
Interests: automatic test; diagnosis; prognosis; testability methods for circuits and systems
Special Issues, Collections and Topics in MDPI journals
Interests: integrated circuits; testing technology; testing equipments
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Whether it is complex electronic systems such as radars, communication systems, and mobile phones, or complex electronic devices such as IGBT, CPU, RAM, SOC, and Chiplet, the safe and reliable operation of systems is a primary concern. In recent years, with the development of microelectronics and artificial intelligence technology, advanced technologies associated with the testing, diagnosis, and prediction processes of electronic systems and devices have emerged.
This Special Issue calls for papers on advanced technologies related to testing, diagnosis and prognosis in electronic systems and devices, such as radars, lithium batteries, and integrated circuits; these include, but are not limited to, test methods, health monitoring, fault feature extraction, diagnostic reasoning methods, performance degradation, life prediction, etc.
Prof. Dr. Bing Long
Prof. Dr. Yindong Xiao
Guest Editors
Manuscript Submission Information
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Keywords
- test methods
- health monitoring
- fault feature extraction
- diagnostic reasoning methods
- performance degradation
- life prediction
- data-driven methods
- model-based methods
- machine learning
- neural network
- electronic systems
- electronic devices
- integrated circuits
- lithium-ion batteries
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