Application of X-ray and Electron to Crystal Structure Characterization
A special issue of Crystals (ISSN 2073-4352). This special issue belongs to the section "Crystal Engineering".
Deadline for manuscript submissions: closed (11 January 2024) | Viewed by 11428
Special Issue Editors
Interests: crystallography; X-ray; crystal structure
Interests: crystallography; X-ray
Special Issue Information
Dear Colleagues,
I would like to welcome you to contribute to the latest Crystals Special Issue, which aims to share the crucial developments and advances in X-ray and electron diffraction methods being applied to the characterization of high-tech nanoscale crystalline structures. The main aim is to provide novel publications that would be of interest to readers and scholars worldwide. Prospective authors are invited to focus on theoretical and experimental studies that would provide substantial progress in understanding the X-ray and electron diffraction fundamentals that eventually enable the decoding of crystal structure data by means of X-ray structure analysis, coherent X-ray 4D optics, X-ray and electron microtomography, ptychography, and so forth.
Prof. Dr. Felix N Chukhovskii
Dr. Konarev V. Petr
Prof. Dr. Vladimir Vladimirovich Volkov
Guest Editors
Manuscript Submission Information
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Keywords
- fundamentals of high-resolution X-ray and fast electron diffraction microtomography
- X-ray reciprocal-space mapping
- X-ray crystal structure analysis
- coherent X-ray 4D optics applications for nanoscale crystal structure determination
- X-ray and electron ptychography analysis
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