Optical and Microstructural Characterization of Thin Layers
A special issue of Crystals (ISSN 2073-4352).
Deadline for manuscript submissions: closed (31 May 2020) | Viewed by 21718
Special Issue Editor
Interests: optical properties; microstructure; spectroscopic ellipsometry; functional coatings
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The optical and microstructural properties of thin layers differ from those of bulk materials. The properties of films strongly depend not only on the type of material used but also on the chosen method of synthesis.
In recent years, new methods for the fabrication of thin films have been developed and classical methods have been modified; however, traditional techniques are still used to produce high-quality layers. Because of the limitations of the synthesis methods, they cannot, generally, be used to obtain any coatings with specific properties. Therefore, it is important to recognize the relationship between the different synthesis methods and the properties of the desired layers. The properties of materials can also be varied by changing their composition as a result of, e.g., doping or alloying.
The aim of this Special Issue is to present the results of recent works on the relationships between growth conditions (or, in general, methods of synthesis) and/or layers modification and optical properties of the resulting layer, as well as microstructure of inorganic and organic films. Papers on multi-layer systems are also welcome.
Dr. Lukasz Skowronski
Guest Editor
Manuscript Submission Information
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Keywords
- microstructure
- optical properties
- thin-film growth
- functional coatings
- characterization