Design of Ultra-Low Voltage/Power Circuits and Systems
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Circuit and Signal Processing".
Deadline for manuscript submissions: closed (30 November 2021) | Viewed by 23474
Special Issue Editors
Interests: ultralow-power CMOS digital; mixed-signal circuits; modeling and design methodologies for leakage- and variability-aware circuits; arithmetic circuits
Special Issues, Collections and Topics in MDPI journals
Interests: low-voltage and low-power circuit design; hybrid CMOS/spintronics circuits and memories; hardware security
Interests: emerging technologies for ultralow-voltage devices and non-volatile memories; circuits for innovative computing applications; CMOS image sensors
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Ultra-low voltage/power analog and digital designs are highly sought-after for tightly energy- and cost-constrained integrated systems such as sensor nodes for the Internet of Things, implantable devices, always-on or purely energy-harvested systems. The latter mandate extremely low power (even down to few nWs) and low minimum supply voltage (<< 1V) to prolong operations under unfavorable environmental conditions, along with small area occupation, low design effort, and technology/design portability. The primary aim of this Special Issue is to attract original research outcomes related to the theory, design, and application of ultra-low voltage/power circuits and systems. Review papers on the topic are also welcome.
Prof. Dr. Marco Lanuzza
Dr. Raffaele De Rose
Dr. Sebastiano Strangio
Guest Editors
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Keywords
- Theory and design of ultra-low voltage/power analog and digital circuits
- Novel applications of ultra-low voltage/power electronics
- Energy-harvested systems
- Implantable and wearable devices for biomedical monitoring applications
- Ultra-low voltage/power circuits for Internet of Things (IoT) applications
- Design techniques to achieve robustness and reliability at reduced power supply voltages
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