Synthesis and Characterization Techniques for Nanomaterials
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: 20 January 2025 | Viewed by 27
Special Issue Editor
Interests: nanomaterials; nanoparticles; crystals; nuclear material; nanocrystals; characterization technique
Special Issue Information
Dear Colleagues,
Research on the engineering of materials on a nanometric scale was triggered by a visionary lecture by Richard Feynman, “There’s plenty of room at the bottom”. Nanomaterials are omnipresent and have a wide range of applications in photonics, microelectronics, metallurgy, catalysis, energy, medicine, and many other fields.
Techniques for the synthesis and characterization of nanomaterials are essential for understanding and manipulating materials’ unique properties at the nanoscale. This variety of uses for nanomaterials is mirrored by an equally large diversity of methods of synthesizing them, including top-down methods—e.g., ion implantation, laser ablation, sol–gel, chemical vapor deposition, ball milling, and chemical reactions—or bottom-up approaches such as molecular beam epitaxy and self-controlling growth in solutions. Characterization techniques such as electron microscopy, X-ray diffraction, and spectroscopy are then employed to analyze the size, shape, structure, and composition of nanomaterials. Characterizing the properties of these nanomaterials can be performed using almost all of the techniques available in physics, chemistry, and engineering.
This Special Issue offers authors a platform to present their latest research, as well as comprehensive reviews or articles, on the synthesis and characterization of nanomaterials in any field of application or fundamental investigation.
Dr. Andreas Kling
Guest Editor
Manuscript Submission Information
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Keywords
- nanomaterials
- ion implantation
- laser ablation
- sol–gel
- chemical vapor deposition
- ball milling
- chemical reactions
- electron microscopy
- X-ray diffraction
- spectral characterization
