EBSD of Additively Manufactured Metals
A special issue of Metals (ISSN 2075-4701). This special issue belongs to the section "Additive Manufacturing".
Deadline for manuscript submissions: closed (30 November 2023) | Viewed by 4603
Special Issue Editors
Interests: EBSD; Orientation Imaging Microscopy; texture analysis; X-Ray diffraction
Interests: materials processing; microstructure-mechanical properties correlations
Interests: neutron and synchrotron radiation technology; metal deformation; phase transformation; shape memory materials; high performance structural materials
Interests: physical and mechanical metallurgy; metal deformation and recrystallization; grain boundary structure
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Special Issue Information
Dear Colleagues,
Additive manufacturing of metals has advanced considerably in the past decade, leading to the production of components from a wide spectrum of alloys and for a wide variety of applications. The local processing conditions under which a part is formed can have very dramatic effects on both the micro- and defect structures within the part. These structures will in turn affect the part’s properties, such as its mechanical behavior and fatigue resistance. Under multiple processing conditions, grain morphologies can be quite complex, and large strain gradients may develop in the microstructure due to rapid solidification. These strain gradients manifest in orientation gradients within grains. Electron backscatter diffraction (EBSD), as observed through scanning electron microscopes (SEM), can be used to capture complex grain structures, orientation gradients, and defect structures within the AM microstructure. Such information can improve our understanding of the effect of various processing parameters on the microstructural evolution of materials and provide critical insights for property prediction models. Microstructural control achievable via additive manufacturing has the unique capability of optimizing a given component’s microstructure by taking advantage of the inherent anisotropy in crystalline materials. The orientation information provided by EBSD is thus a critical variable in microstructural design.
Dr. Stuart Wright
Prof. Dr. Vadlamani Subramanya Sarma
Prof. Dr. Yandong Wang
Prof. Dr. David Field
Guest Editors
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Keywords
- electron backscatter diffraction
- EBSD
- scanning electron microscope
- SEM
- additive manufacturing
- AM microstructure
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