MEMS Packaging Technologies and 3D Integration, 3rd Edition

A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "D:Materials and Processing".

Deadline for manuscript submissions: 31 December 2024 | Viewed by 2488

Special Issue Editor


E-Mail Website
Guest Editor
Center for Nanoscience and Nanotechnology (C2N), University-Paris-Saclay, F-91405 Orsay, France
Interests: packaging; MEMS; integration; bonding; polymer; adhesion
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

MEMS packaging is essential technique to the successful commercialization of MEMS products, as MEMS has moving parts and an application-specific nature. The classic approach to MEMS packaging involves the bonding of silicon or glass cap wafers to MEMS wafers. Therefore, it is typically implemented under high-pressure and high-temperature conditions. Advanced approaches use the thin-film deposition technique, and then the cavity for MEMS is realized via sacrificial etch through access holes at the thin-film cap. The packaging cap transfer technique is a compromise between the two approaches, making it possible to bond and transfer the thin packaging cap to the released MEMS device. MEMS devices and IC are being integrated into 3D fashion to achieve better performance, but the implantable device requires special packaging techniques. Thus, this Special Issue seeks research papers, communications, and review articles that focus on MEMS packaging technologies and related integration methods.

Dr. Seonho Seok
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Micromachines is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • MEMS
  • packaging
  • bonding
  • integration
  • vacuum
  • implantable
  • biocompatibility
  • reliability

Benefits of Publishing in a Special Issue

  • Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
  • Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
  • Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
  • External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
  • e-Book format: Special Issues with more than 10 articles can be published as dedicated e-books, ensuring wide and rapid dissemination.

Further information on MDPI's Special Issue polices can be found here.

Related Special Issues

Published Papers (1 paper)

Order results
Result details
Select all
Export citation of selected articles as:

Research

17 pages, 12847 KiB  
Article
Influence of Pd-Layer Thickness on Bonding Reliability of Pd-Coated Cu Wire
by Junling Fan, Donglin Yuan, Juan Du, Tao Hou, Furong Wang, Jun Cao, Xuemei Yang and Yuemin Zhang
Micromachines 2024, 15(7), 931; https://doi.org/10.3390/mi15070931 - 22 Jul 2024
Cited by 1 | Viewed by 632
Abstract
In this paper, three Pd-coated Cu (PCC) wires with different Pd-layer thicknesses were used to make bonding samples, and the influence of Pd-layer thickness on the reliability of bonded points before and after a high-temperature storage test was studied. The results show that [...] Read more.
In this paper, three Pd-coated Cu (PCC) wires with different Pd-layer thicknesses were used to make bonding samples, and the influence of Pd-layer thickness on the reliability of bonded points before and after a high-temperature storage test was studied. The results show that smaller bonding pressure and ultrasonic power lead to insufficient plastic deformation of the ball-bonded point, which also leads to small contact area with the pad and low bonding strength. Excessive bonding pressure and ultrasonic power will lead to ‘scratch’ on the surface of the pad and large-scale Ag spatter. The wedge-bonded point has a narrowed width when the bonding pressure and ultrasonic power are too small, and the tail edge will be cocked, resulting in false bonding and low strength. When the bonding pressure or ultrasonic power is too large, it will cause stress concentration, and the pad will appear as an ‘internal injury’, which will improve the failure probability; a high-temperature environment can make Cu-Ag intermetallic compounds (IMCs) grow and improve the bonding strength. With the extension of high-temperature storage time, the shear force of Pd100 gradually reaches the peak and then decreases, due to Kirkendall pores caused by excessive growth of IMCs, while the shear force of Pd120 continued to increase due to the slow growth rate of IMCs. In the high-temperature storage test, the thicker the Pd layer of the bonding wire, the higher the bonding strength; in the cold/hot cycle test, the sample with the largest Pd-layer thickness has the lowest failure rate. The thicker the Pd layer, the stronger its ability to resist changes in the external environment, and the higher its stability and reliability. Full article
(This article belongs to the Special Issue MEMS Packaging Technologies and 3D Integration, 3rd Edition)
Show Figures

Figure 1

Back to TopTop