Functional Probes for Scanning Probe Microscopy
A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "A：Physics".
Deadline for manuscript submissions: closed (28 February 2022) | Viewed by 4434
Special Issue Editor
Special Issue Information
Dear Colleagues,
Scanning probe microscopy is one of the most powerful yet versatile experimental techniques offering unparalleled resolution and precision. Modern functional probes, broadly defined, drastically broaden the functionality of conventional scanning probe microscopes for characterization (e.g., physical properties, chemical identities), manipulation (e.g., creation of artificial structures), and fabrication (e.g., nanolithography) at length scales ranging from single atoms to macroscopic wafers. Such advances are made possible, for example, by the maturity of nanofabrication technologies (e.g., smart and nanostructured probes, MEMS probes), the integration of existing scanning probes with additional excitations (e.g., laser, X-ray, microwave, and mechanical excitations), functional modifications of probes (e.g., chemical decoration, superconducting probes), and the implementation of entirely new probes (e.g., the miniaturization and integration of existing technologies to a scanning probe). Accordingly, this Special Issue seeks to showcase research papers, communications, and review articles that focus on technological developments that expand the capabilities of conventional scanning probe microscopy by designing novel probes and measurement techniques, as well as applications of such unconventional scanning probe microscopy in physics, chemistry, materials science, and biology.
Dr. Xiaolong Liu
Guest Editor
Manuscript Submission Information
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Keywords
- scanning probe microscopy
- smart tips
- functional probes
- nanofabrication
- excitation
- characterization
- manipulation
- fabrication
- lithography
- functionalization
