Sign in to use this feature.

Years

Between: -

Subjects

remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline
remove_circle_outline

Journals

Article Types

Countries / Regions

Search Results (190)

Search Parameters:
Keywords = organic thin-film transistors

Order results
Result details
Results per page
Select all
Export citation of selected articles as:
16 pages, 440 KB  
Article
Trap Polarity and the p/n Asymmetry in Oxidised DNTT: A Frontier-Shift Rule
by Matej Matuš, Tomáš Vincze, Michal Hanic, Lubica Stuchlikova and Martin Weis
Materials 2026, 19(15), 3333; https://doi.org/10.3390/ma19153333 - 5 Aug 2026
Viewed by 160
Abstract
Organic thin-film transistors based on dinaphtho[2,3-b:2′,3′-f]thieno[3,2-b]thiophene (DNTT) are attractive for low-cost, large-area electronics, but in unencapsulated devices, atmospheric oxidation generates charge traps whose electronic character—which product traps holes and which traps electrons—has not been mapped systematically. Here, [...] Read more.
Organic thin-film transistors based on dinaphtho[2,3-b:2′,3′-f]thieno[3,2-b]thiophene (DNTT) are attractive for low-cost, large-area electronics, but in unencapsulated devices, atmospheric oxidation generates charge traps whose electronic character—which product traps holes and which traps electrons—has not been mapped systematically. Here, 39 oxygen- and hydroxyl-related defect identities of DNTT are screened with the semi-empirical GFN2-xTB method, complemented by an a priori frontier reactivity index, and classified by the sign of the frontier-level shift. This sign obeys a simple rule: a net π-donating hydroxyl raises the HOMO and yields a hole trap, whereas a net π-accepting carbonyl or quinone lowers the frontier levels and yields a deep electron trap. Hybrid density-functional theory (B3LYP/def2-TZVP) confirms the sign rule and the ordering of the shifts across all closed-shell defect classes. The rule provides a compact, defect-level rationalisation of the well-known asymmetry whereby p-type acenes tolerate air far better than n-type ones. Finally, a hole trap of about 0.255 eV, measured by deep-level transient Fourier spectroscopy, is shown to be consistent with a hydroxyl-related origin, without claiming a unique microscopic assignment. Full article
(This article belongs to the Special Issue Electronic Structure of Novel Semiconducting Materials)
Show Figures

Figure 1

16 pages, 6029 KB  
Article
Low-Temperature ZrAlOx-PVP Hybrid Dielectrics with Crosslinking-Regulated Leakage Suppression for Flexible IGZO TFTs
by Yufei Yue, Honglong Ning, Xuecong Fang, Dongxiang Luo, Chi Yuan, Haitao Zhu, Xu Zhou, Xiaojie Li, Weiguang Xie, Rihui Yao and Junbiao Peng
Inorganics 2026, 14(6), 161; https://doi.org/10.3390/inorganics14060161 - 12 Jun 2026
Viewed by 569
Abstract
Flexible oxide electronics require dielectric layers that combine low-temperature processability, low leakage current, high capacitance density, and mechanical reliability. In this work, we prepared ZrAlOx-PVP hybrid dielectric films through a low-temperature self-combustion solution process at 180 °C and systematically investigated the [...] Read more.
Flexible oxide electronics require dielectric layers that combine low-temperature processability, low leakage current, high capacitance density, and mechanical reliability. In this work, we prepared ZrAlOx-PVP hybrid dielectric films through a low-temperature self-combustion solution process at 180 °C and systematically investigated the effect of PVP doping (0–2 wt%). The results show that PVP promotes the formation of M-O-C related bonding environments, suggesting the construction of an organic–inorganic crosslinked structure. Moderate PVP incorporation effectively suppresses leakage pathways, whereas excessive PVP induces polymer aggregation and trap-assisted conduction. Among all samples, the film on flexible PI (polyimide) with a PVP doping concentration of 0.5 wt% exhibits the best overall performance, with a leakage current as low as 1.89 × 10−8 A/cm2 at 1 MV/cm, a dielectric constant of 8.88. After static bending at a radius of 20 mm, the film maintains stable dielectric behavior, indicating improved stress tolerance. Flexible IGZO TFT fabricated with the optimized dielectric shows a mobility of 11.84 cm2 V−1 s−1, a threshold voltage of 0.48 V, and a subthreshold swing of 0.24 V dec−1 before bending. This work demonstrates that moderate PVP crosslinking provides an effective balance between defect suppression and stress relaxation, offering a practical interface-engineering strategy for low-temperature flexible high-k dielectrics. Full article
(This article belongs to the Special Issue Multifunctional Composites and Hybrid Materials)
Show Figures

Graphical abstract

22 pages, 5705 KB  
Article
A 20 Hz LTPS TFT-Only 8T1C AMOLED Pixel Circuit with over Tenfold Leakage Current Reduction by Source–Drain Voltage Control
by Kook Chul Moon and Jae-Hong Jeon
Electronics 2026, 15(10), 2226; https://doi.org/10.3390/electronics15102226 - 21 May 2026
Viewed by 628
Abstract
Low-refresh-rate driving is an effective way to reduce the power consumption of active-matrix organic light-emitting diode (AMOLED) displays. However, in conventional low-temperature polycrystalline silicon (LTPS) thin-film transistor (TFT) pixel circuits, leakage current through switching TFTs can disturb the stored gate voltage of the [...] Read more.
Low-refresh-rate driving is an effective way to reduce the power consumption of active-matrix organic light-emitting diode (AMOLED) displays. However, in conventional low-temperature polycrystalline silicon (LTPS) thin-film transistor (TFT) pixel circuits, leakage current through switching TFTs can disturb the stored gate voltage of the driving TFT during the long emission period. This causes the time-dependent variation in driving current and visible flicker. In this study, a novel pixel circuit for leakage suppression in low-refresh-rate driving is presented. Bias aging was first applied to reduce the leakage current of the LTPS TFT, and a device model was then built from the characteristics measured at 60 °C. Based on this model, the leakage-induced instability of a conventional 7T1C pixel circuit was analyzed. To suppress this effect, a new 8T1C pixel circuit was proposed. The key idea is to reduce the source–drain voltage of the leakage-sensitive switching TFT during the emission period by raising the initial line potential to a level close to the storage node potential. Simulation results show that the proposed circuit greatly reduces the time-dependent variation in both the driving TFT gate voltage and the driving current compared with the conventional 7T1C circuit. Perceptual evaluation based on human visual sensitivity also confirms stable low-refresh-rate operation down to 20 Hz over the practical gray range. These results show that the proposed circuit is an effective solution for moderate low-refresh-rate operation without relying on low-temperature polycrystalline silicon and oxide (LTPO) technology. Full article
Show Figures

Figure 1

13 pages, 2946 KB  
Article
Processing-Dependent Morphology and Photoluminescence Quenching in Donor–Acceptor PBDTTTPD:PNDI(2HD)2T Thin Films
by Otto Todor-Boer, Bogdan-Ionuț Ștefan, Levente Máthé, Tudor Blaga and Ioan Botiz
Coatings 2026, 16(4), 417; https://doi.org/10.3390/coatings16040417 - 1 Apr 2026
Viewed by 726
Abstract
In this study, we investigate the impact of processing strategies on the nanoscale morphology and photophysical behavior of donor–acceptor thin films composed of the polymeric donor PBDTTTPD and the n-type acceptor PNDI(2HD)2T. The blend morphology and interfacial characteristics were systematically tuned using three [...] Read more.
In this study, we investigate the impact of processing strategies on the nanoscale morphology and photophysical behavior of donor–acceptor thin films composed of the polymeric donor PBDTTTPD and the n-type acceptor PNDI(2HD)2T. The blend morphology and interfacial characteristics were systematically tuned using three distinct fabrication techniques: spin-coating, convective self-assembly, and space-confined solvent vapor annealing. Atomic force microscopy and photoluminescence spectroscopy were employed to elucidate structure–property correlations relevant to all-polymer optoelectronic systems. Films processed via convective self-assembly exhibited nanoscale features with extensive donor–acceptor intermixing, leading to the most efficient photoluminescence quenching of nearly 85%, indicative of enhanced exciton dissociation and charge transfer. In contrast, as-cast films displayed moderately mixed morphologies with approximately 81% quenching, serving as a reference state. The solvent vapor annealing method induced pronounced phase segregation and the formation of larger domains, resulting in reduced photoluminescence quenching efficiency of about 52%. These findings demonstrate that the nanoscale morphology, and consequently the photophysical response, of PBDTTTPD:PNDI(2HD)2T blends can be precisely tailored through processing, providing valuable design guidelines for all-polymer optoelectronic applications such as organic photovoltaics and field-effect transistors. Full article
Show Figures

Figure 1

11 pages, 1438 KB  
Article
Nanoscale Thin-Film Flexible Organic Field-Effect Transistors with Triple PMMA/SiO2/ZnO Gate Insulator Layers
by Sundes Fakher, Furat AI-Saymari, Mohammed Mabrook and Hameed Al-Attar
Micromachines 2026, 17(3), 382; https://doi.org/10.3390/mi17030382 - 21 Mar 2026
Viewed by 664
Abstract
Organic field-effect transistors (OFETs) incorporating a triple insulating layer of polymethyl methacrylate (PMMA), silicon dioxide (SiO2), and zinc oxide (ZnO) were successfully fabricated on glass and on flexible PET substrates. The insulating layers significantly enhanced device performance, with the OFETs achieving [...] Read more.
Organic field-effect transistors (OFETs) incorporating a triple insulating layer of polymethyl methacrylate (PMMA), silicon dioxide (SiO2), and zinc oxide (ZnO) were successfully fabricated on glass and on flexible PET substrates. The insulating layers significantly enhanced device performance, with the OFETs achieving field-effect mobility (µ) values more than twice as high as those reported in the literature. Specifically, mobility values of ~6.75 cm2/V·s were recorded on glass, ~7.14 cm2/V·s on flexible substrates before bending, and ~6.88 cm2/V·s on flexible substrates after bending. Threshold voltages (Vth) of −7 V and −9 V were estimated for the flexible OFETs before and after bending, respectively, along with a high on/off current ratio, exceeding 103 for all devices. Minimal hysteresis in the transfer and output characteristics indicated excellent, trap-free interaction between the insulating layers and the pentacene. The high dielectric constant of the PMMA/SiO2/ZnO triple insulating layers was identified as a critical factor driving the exceptional performance, stability, and low hysteresis of the OFETs. These results underscore the pivotal role of advanced insulating layers in optimizing OFET performance and durability. Full article
(This article belongs to the Section D1: Semiconductor Devices)
Show Figures

Figure 1

9 pages, 1109 KB  
Article
Thiol-Amine Processed PbS Thin Films for Enhanced Near-Infrared Photodetection
by Yuanze Hong, Zhipeng Wei and Xiaohua Wang
Nanomaterials 2026, 16(6), 363; https://doi.org/10.3390/nano16060363 - 17 Mar 2026
Cited by 1 | Viewed by 689
Abstract
Developing reliable processing routes for semiconductor thin films is essential for advancing photodetection technologies. The amine-thiol solvent system, in comparison with other liquid-phase synthesis methods, does not necessitate stepwise ion-exchange reactions. It is capable of obtaining the target semiconductor thin film by directly [...] Read more.
Developing reliable processing routes for semiconductor thin films is essential for advancing photodetection technologies. The amine-thiol solvent system, in comparison with other liquid-phase synthesis methods, does not necessitate stepwise ion-exchange reactions. It is capable of obtaining the target semiconductor thin film by directly dissolving bulk powder followed by subsequent annealing. Although PbO can be dissolved in this solvent as a raw material to obtain PbS thin films, the structural evolution, optical properties, and photodetection performance of the films obtained via this solvent system still require further exploration. This solvent system was employed to prepare PbS thin films, and a comprehensive investigation was carried out on the evolution of their structure, morphology, and optical properties during preheating and annealing treatments. During preheating, the films exhibit directional ordering within the organic matrix, which converts into phase-pure PbS upon annealing. Based on the optimized films, interdigitated photodetectors and hybrid devices integrated with graphene transistors are fabricated. The resulting devices exhibit strong photoresponse and operational stability, demonstrating the viability of amine-thiol-processed PbS films for photodetection applications. Full article
Show Figures

Figure 1

32 pages, 6543 KB  
Review
MOCVD Growth of Next-Generation III–V Semiconductor Devices: In Review
by Zoya Noor, Muhammad Usman, Shazma Ali, Anis Naveed, Amina Hafeez and Ahmed Ali
Photonics 2026, 13(3), 273; https://doi.org/10.3390/photonics13030273 - 12 Mar 2026
Cited by 1 | Viewed by 5744
Abstract
Metal–organic chemical vapor deposition (MOCVD) is a crystal growth technique used to achieve high-purity thin films, especially III–V materials, for fabricating semiconductor devices. It allows for thickness tunability, controlled doping, and composition of epilayers. This review focuses on the principle of MOCVD, its [...] Read more.
Metal–organic chemical vapor deposition (MOCVD) is a crystal growth technique used to achieve high-purity thin films, especially III–V materials, for fabricating semiconductor devices. It allows for thickness tunability, controlled doping, and composition of epilayers. This review focuses on the principle of MOCVD, its historical background, and its applications in III–V semiconductor devices such as solar cells, high electron mobility transistors (HEMTs), light-emitting diodes (LEDs), laser diodes (LDs), and photonic integrated circuits (PICs). This review highlights the recent developments in MOCVD aimed at improving its efficiency, performance, and sustainability. Finally, we emphasize emerging trends and challenges in MOCVD process innovation, reactor design, and material integration that are poised to drive the development of next-generation optoelectronic, photonic, and quantum technologies. Together, these findings underscore MOCVD’s pivotal role in enabling high-performance devices and sustaining leadership in post-Moore semiconductor technologies. Full article
Show Figures

Graphical abstract

13 pages, 7651 KB  
Article
Filtered Cathodic Vacuum Arc Deposition for Inkjet-Printed OLED Encapsulation
by Zhuo Gao, Songju Li, Lei Wang, Lin Chen, Xianwen Sun and Dong Fu
Materials 2026, 19(3), 638; https://doi.org/10.3390/ma19030638 - 6 Feb 2026
Cited by 1 | Viewed by 850
Abstract
To improve the low deposition rate of atomic layer deposition (ALD), we introduced filtered cathodic vacuum arc (FCVA) technology for the high-rate deposition of Al2O3 films. The FCVA-Al2O3 process achieved a deposition rate of 15 nm/min, which [...] Read more.
To improve the low deposition rate of atomic layer deposition (ALD), we introduced filtered cathodic vacuum arc (FCVA) technology for the high-rate deposition of Al2O3 films. The FCVA-Al2O3 process achieved a deposition rate of 15 nm/min, which is approximately an order of magnitude higher than that of conventional ALD. This process does not involve hydrogen, preventing hydrogen ion penetration and thereby ensuring the high stability of the oxide TFT backplane. FCVA-Al2O3 films were integrated with inkjet-printed (IJP) organic layers to form a hybrid thin-film encapsulation (TFE) structure for OLEDs. The resulting laminated encapsulation exhibited excellent water vapor barrier properties (WVTR, Water Vapor Transmission Rate of 1.2 × 10−4 g/m2/day), demonstrating the great potential of FCVA for packaging high-throughput and high-performance flexible electronics. In addition to evaluating barrier properties (surface roughness, residual stress, and WVTR) to assess the suitability of TFE, the impact of FCVA technology was assessed via oxide thin-film transistor (TFT) electrical performance and OLED device reliability tests. The electrical properties of oxide TFTs show no significant degradation post-encapsulation, while OLED performance, despite a slight increase in current efficiency, remains effectively unchanged. Additionally, the lifetime of OLED devices reached 300 h under accelerated aging conditions (85 °C, 85% relative humidity), which is nearly twice that of devices without FCVA-Al2O3 encapsulation. Full article
Show Figures

Graphical abstract

13 pages, 2707 KB  
Article
An Investigation of the Electrical Performance of Polymer-Based Stretchable TFTs Under Mechanical Strain Using the Y-Function Method
by Hyunjong Lee, Hyunbum Kang, Chanho Jeong, Insung Choi, Sohee Kim, Eunki Baek, JongKwon Lee, Dongwook Kim, Jaehoon Park, Gae Hwang Lee and Youngjun Yun
Polymers 2026, 18(3), 419; https://doi.org/10.3390/polym18030419 - 5 Feb 2026
Viewed by 1079
Abstract
Stretchable semiconductors capable of maintaining electrical performance under large mechanical deformation are essential for reliable wearable electronic devices. However, polymer semiconductors often suffer from electrical degradation when subjected to tensile strain. In this study, electrical stability under strain was achieved by using a [...] Read more.
Stretchable semiconductors capable of maintaining electrical performance under large mechanical deformation are essential for reliable wearable electronic devices. However, polymer semiconductors often suffer from electrical degradation when subjected to tensile strain. In this study, electrical stability under strain was achieved by using a rubber-blended poly(2,5-bis(2-octyldodecyl)-3,6-di(thiophen-2-yl)diketopyrrolo[3,4-c]pyrrole-1,4-dione-alt-thieno[3,2-b]thiophene) (DPPT-TT) polymer semiconductor based on a conjugated polymer/elastomer phase separation-induced elasticity (CONPHINE) structure. Unlike most previous studies on fully stretchable thin-film transistors (TFTs), which primarily report overall performance changes under mechanical strain, this work systematically identifies the dominant origin of electrical performance degradation through a stepwise electrical analysis encompassing the gate insulating layer, the semiconductor layer, and complete devices. Bottom-gate top-contact (BGTC) and bottom-gate bottom-contact (BGBC) devices were fabricated on rigid Si/SiO2 substrates to examine the intrinsic properties of the DPPT-TT/styrene-ethylene-butylene-styrene (SEBS) CONPHINE film. As a result, the device exhibits 90% mobility retention even at 100% tensile strain applied parallel to the charge transport direction. Quantitative resistance analysis using the Y-function method reveals that variations in channel resistance play a dominant role in strain-induced performance degradation, whereas changes in contact resistance contribute only marginally. These findings demonstrate that stabilizing channel resistance, rather than contact resistance, is important for achieving high mobility retention under large mechanical deformation, thereby providing concrete and quantitative design guidelines for reliable stretchable TFTs. Full article
Show Figures

Figure 1

15 pages, 3735 KB  
Article
Enhanced Current Saturation in IGZO Thin Film Transistors Using a Source-Connected Bottom Gate Structure
by Jae-Hong Jeon
Coatings 2026, 16(2), 161; https://doi.org/10.3390/coatings16020161 - 27 Jan 2026
Cited by 1 | Viewed by 1234
Abstract
Channel length modulation (CLM) in indium gallium zinc oxide (IGZO) thin film transistors (TFTs) reduces the output resistance (ro) in the saturation regime. It also degrades current driving accuracy for active matrix organic light emitting diode (AMOLED) backplanes. For top [...] Read more.
Channel length modulation (CLM) in indium gallium zinc oxide (IGZO) thin film transistors (TFTs) reduces the output resistance (ro) in the saturation regime. It also degrades current driving accuracy for active matrix organic light emitting diode (AMOLED) backplanes. For top gate, self-aligned devices with nominal channel lengths of 5–15 μm, transmission line method (TLM) analysis yields an effective channel length reduction (ΔL) of about 1.8 μm. This result is consistent with lateral hydrogen redistribution from the self-aligned source/drain (S/D) process. At L = 5 μm, the conventional TFT exhibits ro = 13.5 ± 2.5 MΩ and an Early voltage (VA) = 56.1 ± 10.4 V (n = 5). We propose a source connected bottom gate (SCBG) structure that electrostatically stabilizes the pinch-off region and suppresses CLM. The SCBG TFT increases ro to 475 ± 52 MΩ and VA to 1159 ± 173 V at L = 5 μm (n = 5), while maintaining normal transfer characteristics. Two-dimensional device simulations reproduce the trend and show that the drain-bias-induced pinch-off shift is reduced, with dL)/dVDS decreasing from 0.027 to 0.012 μm/V (about 55%). These results indicate that the SCBG approach is effective for enhancing current saturation in short channel IGZO TFTs for high-resolution AMOLED applications. Full article
(This article belongs to the Special Issue Recent Advances in Thin-Film Transistors: From Design to Application)
Show Figures

Figure 1

9 pages, 3420 KB  
Proceeding Paper
Piezoelectric Ultrasonic Transducer with High Performance OTFT for Flow Rate, Occlusion and Bubble Detection Portable Peritoneal Dialysis System
by Azrul Azlan Hamzah, Jumril Yunas, Abdul Halim Abdul Gafor, Ruslinda Mustafar, Reni Silvia Nasution, Yusniza Yunus, Jahariah Sampe, Abdul Hafiz Mat Sulaiman, Arifah Syahirah Abdul Rahman and Ahmad Ghadafi Ismail
Eng. Proc. 2025, 110(1), 5; https://doi.org/10.3390/engproc2025110005 - 12 Dec 2025
Viewed by 2074
Abstract
A piezoelectric ultrasonic transducer has been developed to detect flow rate, occlusion, and bubble formation in a portable peritoneal dialysis system. This transducer works by utilizing the piezoelectric effect to convert electrical energy into ultrasonic waves and detect the reflected waves through the [...] Read more.
A piezoelectric ultrasonic transducer has been developed to detect flow rate, occlusion, and bubble formation in a portable peritoneal dialysis system. This transducer works by utilizing the piezoelectric effect to convert electrical energy into ultrasonic waves and detect the reflected waves through the tube wall. In addition, organic thin film transistors (OTFTs) were tested at annealing temperatures of 75 °C, 100 °C, and 125 °C to evaluate the effect of temperature on mobility and on/off ratio. The best results were obtained at 100 °C with a mobility of 0.816 cm2/Vs and an on/off ratio of 1.4 × 103 correlated with grain size. This study aims to report the fabrication process and initial characterization of the OTFT device as a first step towards the development of a portable biosensor that can be integrated into a point-of-care system. The transducer is designed for use in PeritoCare® (Bangi, Malaysia), a portable peritoneal dialysis system developed by Universiti Kebangsaan Malaysia (UKM). The integration of piezoelectric transducers and OTFTs into the PeritoCare® system enables the development of a more flexible, efficient, and mobile peritoneal dialysis system for young, active end-stage renal disease (ESRD) patients. Full article
(This article belongs to the Proceedings of The 2nd International Conference on AI Sensors and Transducers)
Show Figures

Figure 1

44 pages, 5217 KB  
Review
Advances in Polymeric Semiconductors for Next-Generation Electronic Devices
by Ju Won Lim
Polymers 2025, 17(23), 3174; https://doi.org/10.3390/polym17233174 - 28 Nov 2025
Cited by 5 | Viewed by 2380
Abstract
Polymeric semiconductors have rapidly evolved from early conductive polymers, such as polyacetylene, to high-performance donor–acceptor copolymers, offering a unique combination of mechanical flexibility, solution processability, and tunable optoelectronic properties. These advancements have positioned polymeric semiconductors as versatile materials for next-generation electronics, including wearable, [...] Read more.
Polymeric semiconductors have rapidly evolved from early conductive polymers, such as polyacetylene, to high-performance donor–acceptor copolymers, offering a unique combination of mechanical flexibility, solution processability, and tunable optoelectronic properties. These advancements have positioned polymeric semiconductors as versatile materials for next-generation electronics, including wearable, stretchable, and bio-integrated devices, IoT systems, and soft robotics. In this review, we systematically present the fundamental principles of polymeric semiconductors, including electronic structure, charge transport mechanisms, molecular packing, and solid-state morphology, and elucidate how these factors collectively govern device performance. We further discuss recent advances in synthesis strategies, thin-film processing techniques, molecular doping, and interface engineering, emphasizing their critical roles in improving operational stability, charge-carrier mobility, and energy efficiency. Key applications—such as organic photovoltaics, field-effect transistors, neuromorphic devices, and memristors—are analyzed, with a focus on the intricate structure–property–performance relationships that dictate functionality. Finally, we highlight emerging directions and scientific innovations, including sustainable and degradable polymers, hybrid and two-dimensional polymer systems, and novel strategies to enhance device stability and performance. By integrating fundamental polymer science with device engineering, this review provides a comprehensive, structured, and forward-looking perspective, identifying knowledge gaps and offering insights to guide future breakthroughs and the rational design of high-performance, multifunctional, and environmentally responsible polymeric electronic devices. Full article
(This article belongs to the Special Issue Polymeric Materials in Optoelectronic Devices and Energy Applications)
Show Figures

Graphical abstract

15 pages, 5065 KB  
Article
A 31-Inch AMOLED Display Integrating a Gate Driver with Metal Oxide TFTs
by Xianjie Zhou, Qiming Zeng, Li Guo, Yicheng Yu, Fei Yu, Guo Tian, Xiaopeng Lu, Zhiqiang Zhang, Baixiang Han and Yan Xue
Micromachines 2025, 16(12), 1325; https://doi.org/10.3390/mi16121325 - 26 Nov 2025
Cited by 1 | Viewed by 1406
Abstract
Gate driver-on-array (GOA) circuits employing amorphous indium–gallium–zinc oxide (IGZO)-based thin-film transistors (TFTs) have been successfully utilized to generate the driving signals for the commercialization of active-matrix organic light-emitting diode (AMOLED) displays. The depletion-mode TFTs in GOA circuits can be completely turned off by [...] Read more.
Gate driver-on-array (GOA) circuits employing amorphous indium–gallium–zinc oxide (IGZO)-based thin-film transistors (TFTs) have been successfully utilized to generate the driving signals for the commercialization of active-matrix organic light-emitting diode (AMOLED) displays. The depletion-mode TFTs in GOA circuits can be completely turned off by the introduction of series-connected, two-transistor, dual low-voltage-level power signals. Simulation results demonstrate that a GOA exhibits high process stability with a threshold voltage margin from −5 V to +5 V. Furthermore, the GOA output characterization and mobility compensation effect are evaluated by the integration of the GOA and pixel in a 31-inch 4K AMOLED display. Experimental results demonstrate that full-swing driving pulses can be obtained with the GOA. Finally, the stripe mura in the display caused by mobility variation can be successfully eliminated by the introduction of GOA circuits. Full article
(This article belongs to the Topic Advanced Integrated Circuit Design and Application)
Show Figures

Figure 1

34 pages, 6142 KB  
Review
Grain Boundary Engineering for High-Mobility Organic Semiconductors
by Zhengran He, Kyeiwaa Asare-Yeboah and Sheng Bi
Electronics 2025, 14(15), 3042; https://doi.org/10.3390/electronics14153042 - 30 Jul 2025
Cited by 8 | Viewed by 2881
Abstract
Grain boundaries are among the most influential structural features that control the charge transport in polycrystalline organic semiconductors. Acting as both charge trapping sites and electrostatic barriers, they disrupt molecular packing and introduce energetic disorder, thereby limiting carrier mobility, increasing threshold voltage, and [...] Read more.
Grain boundaries are among the most influential structural features that control the charge transport in polycrystalline organic semiconductors. Acting as both charge trapping sites and electrostatic barriers, they disrupt molecular packing and introduce energetic disorder, thereby limiting carrier mobility, increasing threshold voltage, and degrading the stability of organic thin-film transistors (OTFTs). This review presents a detailed discussion of grain boundary formation, their impact on charge transport, and experimental strategies for engineering their structure and distribution across several high-mobility small-molecule semiconductors, including pentacene, TIPS pentacene, diF-TES-ADT, and rubrene. We explore grain boundary engineering approaches through solvent design, polymer additives, and external alignment methods that modulate crystallization dynamics and domain morphology. Then various case studies are discussed to demonstrate that optimized processing can yield larger, well-aligned grains with reduced boundary effects, leading to great mobility enhancements and improved device stability. By offering insights from structural characterization, device physics, and materials processing, this review outlines key directions for grain boundary control, which is essential for advancing the performance and stability of organic electronic devices. Full article
(This article belongs to the Special Issue Feature Papers in Electronic Materials)
Show Figures

Figure 1

35 pages, 8296 KB  
Review
Bridging Additive Manufacturing and Electronics Printing in the Age of AI
by Jihua Chen, Yue Yuan, Qianshu Wang, Hanyu Wang and Rigoberto C. Advincula
Nanomaterials 2025, 15(11), 843; https://doi.org/10.3390/nano15110843 - 31 May 2025
Cited by 14 | Viewed by 6236
Abstract
Printing techniques have been instrumental in developing flexible and stretchable electronics, including organic light-emitting diode displays, organic thin film transistor arrays, electronic skins, organic electrochemical transistors for biosensors and neuromorphic computing, as well as flexible solar cells with low-cost processes such as inkjet [...] Read more.
Printing techniques have been instrumental in developing flexible and stretchable electronics, including organic light-emitting diode displays, organic thin film transistor arrays, electronic skins, organic electrochemical transistors for biosensors and neuromorphic computing, as well as flexible solar cells with low-cost processes such as inkjet printing, ultrasonic nozzle, roll-to-roll coating. The rise of additive manufacturing provides even more opportunities to print electronics in automated and customizable ways. In this work, we will review the current technologies of printing electronics (including printed batteries, supercapacitors, fuel cells, and sensors), especially with 3D printing. In this age of ongoing AI revolution, the application of AI algorithms is discussed in terms of combining them with 3D printing and electronics printing for a future with automated optimization, sustainable design, and customizable and scalable manufacturing. Full article
(This article belongs to the Special Issue The Future of Nanotechnology: Healthcare and Manufacturing)
Show Figures

Graphical abstract

Back to TopTop