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Journal: Electronics, 2019
Volume: 8
Number: 657

Article: Mechanism of Degradation Rate on the Irradiated Double-Polysilicon Self-Aligned Bipolar Transistor
Authors: by Mohan Liu, Wu Lu, Xin Yu, Xin Wang, Xiaolong Li, Shuai Yao and Qi Guo
Link: https://www.mdpi.com/2079-9292/8/6/657

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