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Polycrystalline Materials–from Design to (Micro)Structural Characterization and Applications

This special issue belongs to the section "Crystal Engineering".

Special Issue Information

Keywords

  • structure determination from PXRD data
  • microstructural analysis
  • powder diffraction software
  • Rietveld refinement
  • polycrystalline thin films
  • synchrotron radiation
  • spin coating
  • mechanochemistry
  • solvothermal synthesis
  • electrochemical materials
  • magnetic materials
  • thermal expansion materials
  • porous materials

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Published Papers

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Crystals - ISSN 2073-4352