Development and Application of New CMOS Devices

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Semiconductor Devices".

Deadline for manuscript submissions: closed (31 December 2022) | Viewed by 2461

Special Issue Editor


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1. ATV Automatisierungs Techniques Voigt, Heilbronner Str.17, 01089 Dresden, Germany
2. MPI Corporation, Advanced Semiconductor Test Division, Chungho St. 155, Chupei, Hsinchu 302, Taiwan
Interests: vector network analyzer calibration; automated measurement systems; high-frequency noise; harmonic distortion; low-frequency noise; vectorial and passive load pull characterization of on-wafer SiGe; AIIIBV HBTs; CMOS; HEMTs and emerging technology devices (CNTs, graphene FETs); characterization of MMICs, particularly LNA, PA, mixers, frequency multipliers and other circuits
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Special Issue Information

Dear Colleagues,

The development of complementary metal–oxide semiconductor (CMOS) technology enabled the very wide use of advanced technology devices for a number of various applications: mm-Wave circuits, front end 60 GHz receivers, 5G communication circuits, low-noise amplifiers (LNAs), including cryogenics for deep space antenna areas, stacked transistor power amplifiers (PAs), nano-electro-mechanical switches for computing applications, artificial intelligence applications, biosensors for environmental sensing, safety monitoring and clinical diagnosis, temperature sensing, CMOS–memristor hybrid circuits, RF cryogenic oscillators, THz frequency signal detection sensors, W-band ring oscillators and others. All those applications require an advanced CMOS technology in particular down-scaled nodes. CMOS with scaled gate length down to 26 nm already results in a cut-off frequency increase beyond 450 GHz, reduced flicker noise and increased drive current. Further scaling down to 5 nm was reported by TSMC, enabling a 15% speed improvement with 30% power consumption reduction compared to 7 nm nodes. Such downscaled devices to minimize the impact of parasitic capacitances and resistances require optimized architectures (FinFET, nanosheet FET, forksheet FET, complementary FET). An optimized 5 nm CMOS device architecture was reported in. Downscaling results in higher parasitic capacitances and higher series resistances, setting a limitation for analog high-frequency applications, where fT and fmax matter. For deeply scaled CMOS devices, maintaining high fT or transconductance over the gate capacitance (gm/Cg) is difficult due to gm limitations and simultaneous Cg increase with gate node decrease. Another drawback of downscaled CMOS is an increase of gate resistance, Rg, implying RF noise degradation. Scaled CMOS technology exploits low-voltage supply and features a high level of parasitics. Circuits such as ADC will benefit from analog design downscaling, while mm-Wave front-end modules suffer from the low power levels that CMOS can deliver. An increasing demand of higher-speed computing and lower power consumption will continue the further development of CMOS technology. Optimized for high-frequency performance, FinFETs with a 22 nm technology node with ft/fmax of 280/460 GHz were used to fabricate a 60–90 GHz LNA with a gain of 20 dB and noise figure NF = 3.7dB and a power amplifier (PA) with 17dB of power gain GP at 75 GHz.

We call for papers covering CMOS technology development, as well as circuit design solutions (analog/digital) using advanced CMOS technology.

Dr. Paulius Sakalas
Guest Editor

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Keywords

  • CMOS
  • FinFET
  • complementary FET
  • nanosheet FET
  • forksheet FET downscaling
  • millimeter-wave circuits
  • optical communication
  • automotive radar
  • ADC

Published Papers (1 paper)

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Research

6 pages, 1893 KiB  
Article
Optimal Bias Condition of Dummy WL for Sub-Block GIDL Erase Operation in 3D NAND Flash Memory
by Beomsu Kim and Myounggon Kang
Electronics 2022, 11(17), 2738; https://doi.org/10.3390/electronics11172738 - 31 Aug 2022
Cited by 1 | Viewed by 1875
Abstract
In this study, we have analyzed the optimal bias condition of dummy WL for the sub-block gate induced drain leakage (GIDL) erase operation in 16-layer 3D NAND flash memory. Three-dimensional NAND flash memory performs an erase operation in units of pages. Increasing the [...] Read more.
In this study, we have analyzed the optimal bias condition of dummy WL for the sub-block gate induced drain leakage (GIDL) erase operation in 16-layer 3D NAND flash memory. Three-dimensional NAND flash memory performs an erase operation in units of pages. Increasing the number of stacks increases the number of cells that are erased at one time, which can lead to undesirable durability degradation. In this case, the sub-block erase operation can reduce the burden on the cell by up to half, due to the erase operation. The distribution of the hole density (hDensity) and the potential, according to VDummy, was analyzed when block1 and block2 were erased by setting WL0:WL7 to block1, WL9:WL15 to block2, and WL8 to dummy WL. For the simulation results, block1 showed an optimal distribution of hDensity and potential in the order of 20 V, floating, and 0 V. In block2, the optimal distribution of hDensity was shown in the order of 20 V, floating, and 0 V, with the optimal distribution of the potential in the order of floating and 0 V. Full article
(This article belongs to the Special Issue Development and Application of New CMOS Devices)
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