Optical Spectroscopy Characterizations of Low-Dimensional Nanomaterials
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Synthesis, Interfaces and Nanostructures".
Deadline for manuscript submissions: 31 December 2024 | Viewed by 1405
Special Issue Editors
Interests: low-dimensional nanomaterials; optical anisotropy; spectroscopic characterization; heterostructures
Special Issue Information
Dear Colleagues,
Optical spectroscopy enables the precise measurement of materials at atomic, molecular, and macromolecular scales, which is a pivotal tool that aids in understanding, manufacturing, and controlling matter engineering of low-dimensional materials, heterostructures, and nanosystems. In particular, with the ultimate pursuit of decreased thickness approaching single atomic layer levels, low-dimensional materials can exhibit novel or distinct properties compared with their counterpart bulk materials, which could be revealed with the help of optical spectroscopy methods, including linear, non-linear, and photoelectron spectroscopy methods. Besides, due to their inherently small size, accurately characterizing the fundamental physical and chemical properties of low-dimensional materials is still challenging, and novel approaches promoting sensitivity, resolution, speed, model fitting, etc., are highly desired.
This Special Issue focuses on the current state-of-the-art in characterizing low-dimensional materials via optical spectroscopy and the advanced development of optical spectroscopy instrumentations applied for unique application scenarios, such as in situ growth monitoring, manipulating and defect engineering, etc. It aims to attract both academic and industrial researchers in order to foster the current knowledge of low-dimensional materials and applications, and to present new ideas for characterizing technologies.
We look forward to receiving your contributions.
Dr. Wanfu Shen
Dr. Honggang Gu
Guest Editors
Manuscript Submission Information
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Keywords
- low-dimensional materials
- optical spectroscopy
- optical spectroscopy instrumentations
- in situ monitoring
- low-symmetrical materials
- heterostructures
- defect engineering
