Xu, X.; Du, X.; Jin, Y.; Wang, Y.; Wang, Z.; Zhao, J.; Wang, C.; Liu, X.; Chen, C.; Deng, P.;
et al. Characterization and Fine Mapping of the Stay-Green-Related Spot Leaf Gene TaSpl1 with Enhanced Stripe Rust and Powdery Mildew Resistance in Wheat. Int. J. Mol. Sci. 2025, 26, 4002.
https://doi.org/10.3390/ijms26094002
AMA Style
Xu X, Du X, Jin Y, Wang Y, Wang Z, Zhao J, Wang C, Liu X, Chen C, Deng P,
et al. Characterization and Fine Mapping of the Stay-Green-Related Spot Leaf Gene TaSpl1 with Enhanced Stripe Rust and Powdery Mildew Resistance in Wheat. International Journal of Molecular Sciences. 2025; 26(9):4002.
https://doi.org/10.3390/ijms26094002
Chicago/Turabian Style
Xu, Xiaomin, Xin Du, Yanlong Jin, Yanzhen Wang, Zhenyu Wang, Jixin Zhao, Changyou Wang, Xinlun Liu, Chunhuan Chen, Pingchuan Deng,
and et al. 2025. "Characterization and Fine Mapping of the Stay-Green-Related Spot Leaf Gene TaSpl1 with Enhanced Stripe Rust and Powdery Mildew Resistance in Wheat" International Journal of Molecular Sciences 26, no. 9: 4002.
https://doi.org/10.3390/ijms26094002
APA Style
Xu, X., Du, X., Jin, Y., Wang, Y., Wang, Z., Zhao, J., Wang, C., Liu, X., Chen, C., Deng, P., Li, T., & Ji, W.
(2025). Characterization and Fine Mapping of the Stay-Green-Related Spot Leaf Gene TaSpl1 with Enhanced Stripe Rust and Powdery Mildew Resistance in Wheat. International Journal of Molecular Sciences, 26(9), 4002.
https://doi.org/10.3390/ijms26094002