Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties
Abstract
:1. Introduction
2. Theory of Operation
2.1. Multiple Feedback Transimpedance Amplifier
2.2. Integrating Current-to-Voltage Converter Module
2.3. SSRM Reference Current-Based Module
3. Material and Methods
4. Test Results
4.1. MFTIA Module Tests
4.2. Integrating Current-to-Voltage Converter Module Tests
4.3. SSRM Reference Current-Based Module Tests
5. Discussion and Conclusions
5.1. Summary
5.2. Comparison with Existing Solutions
5.3. Future Applications
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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MFTiA | Integrating I/V Converter | SSRM | TC-CAFM by JPK | ORCA Mode by Oxford Instruments | C-AFM by Park Systems | |
---|---|---|---|---|---|---|
Amplification min. | 107 | Integrating | Exponential | Hard-set | 5 × 107 | 103 |
Amplification max. | 1010, Exponential | Integrating | Exponential | 109 | 5 × 109 | 109 |
Voltage range | ±6 V | ±12 V | ±12 V | ±10 V | ±10 V | ±10 V |
Current range | ±100 μA | ±688.12 nA | 100 fA–10 μA | ±10 nA | −6 pA–+10 μA | ±10 mA |
Resolution | <3 pA | <2.3 fA | <100 fA | 100 fA | <1 pA | <300 fA |
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Sikora, A.; Gajewski, K.; Badura, D.; Pruchnik, B.; Piasecki, T.; Raczkowski, K.; Gotszalk, T. Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties. Sensors 2024, 24, 5649. https://doi.org/10.3390/s24175649
Sikora A, Gajewski K, Badura D, Pruchnik B, Piasecki T, Raczkowski K, Gotszalk T. Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties. Sensors. 2024; 24(17):5649. https://doi.org/10.3390/s24175649
Chicago/Turabian StyleSikora, Andrzej, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski, and Teodor Gotszalk. 2024. "Conductive Atomic Force Microscopy—Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties" Sensors 24, no. 17: 5649. https://doi.org/10.3390/s24175649