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Journal: Materials, 2025
Volume: 18
Number: 1980
Article:
Stability Improvement of Solution-Processed Metal Oxide Thin-Film Transistors Using Fluorine-Doped Zirconium Oxide Dielectric
Authors:
by
Haoxuan Xu, Bo Deng and Xinan Zhang
Link:
https://www.mdpi.com/1996-1944/18/9/1980
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