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Journal: Materials, 2025
Volume: 18
Number: 1980

Article: Stability Improvement of Solution-Processed Metal Oxide Thin-Film Transistors Using Fluorine-Doped Zirconium Oxide Dielectric
Authors: by Haoxuan Xu, Bo Deng and Xinan Zhang
Link: https://www.mdpi.com/1996-1944/18/9/1980

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