Lu, X.; Lu, Z.; Wu, Q.; Wang, J.; Yang, C.; Sun, S.; Shao, D.; Liu, K.
Soft Fault Diagnosis of Analog Circuit Based on EEMD and Improved MF-DFA. Electronics 2023, 12, 114.
https://doi.org/10.3390/electronics12010114
AMA Style
Lu X, Lu Z, Wu Q, Wang J, Yang C, Sun S, Shao D, Liu K.
Soft Fault Diagnosis of Analog Circuit Based on EEMD and Improved MF-DFA. Electronics. 2023; 12(1):114.
https://doi.org/10.3390/electronics12010114
Chicago/Turabian Style
Lu, Xinmiao, Zihan Lu, Qiong Wu, Jiaxu Wang, Cunfang Yang, Shuai Sun, Dan Shao, and Kaiyi Liu.
2023. "Soft Fault Diagnosis of Analog Circuit Based on EEMD and Improved MF-DFA" Electronics 12, no. 1: 114.
https://doi.org/10.3390/electronics12010114
APA Style
Lu, X., Lu, Z., Wu, Q., Wang, J., Yang, C., Sun, S., Shao, D., & Liu, K.
(2023). Soft Fault Diagnosis of Analog Circuit Based on EEMD and Improved MF-DFA. Electronics, 12(1), 114.
https://doi.org/10.3390/electronics12010114