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Journal: Electronics, 2023
Volume: 12
Number: 2886

Article: Oxide Electric Field-Induced Degradation of SiC MOSFET for Heavy-Ion Irradiation
Authors: by Xiaowen Liang, Haonan Feng, Yutang Xiang, Jing Sun, Ying Wei, Dan Zhang, Yudong Li, Jie Feng, Xuefeng Yu and Qi Guo
Link: https://www.mdpi.com/2079-9292/12/13/2886

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