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Journal: Electronics, 2024
Volume: 13
Number: 1445

Article: Simple Modeling and Analysis of Total Ionizing Dose Effects on Radio-Frequency Low-Noise Amplifiers
Authors: by Taeyeong Kim, Gyungtae Ryu, Jongho Lee, Moon-Kyu Cho, Daniel M. Fleetwood, John. D. Cressler and Ickhyun Song
Link: https://www.mdpi.com/2079-9292/13/8/1445

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