Open-Set Recognition Model Based on Negative-Class Sample Feature Enhancement Learning Algorithm
Abstract
:1. Introduction
- Known known classes (KKCs): the classes with distinctly labeled positive training samples.
- Known unknown classes (KUCs): labeled negative samples, but do not belong to any class.
- Unknown known classes (UKCs): classes with no available samples in training, but available side information such as semantic/attribute information.
- Unknown unknown classes (UUCs): classes without any information regarding them during training.
2. Related work
2.1. Meta Recognition and Extreme Value Theory
2.2. Support Vector Domain Tightly Wrapping Description Design (SVDTWDD)
3. Proposed Method
3.1. Construction Stage of Negative-Class Sample Feature Set
3.1.1. Optimization Algorithm for Compactness Parameter of Negative-Class Sample Features
- Step 1:
- calculate sample point nearest-neighbor points
- Step 2:
- calculate the maximum distance between sample point and the nearest neighbor
- Step 3:
- calculate the suboptimal estimate of the compactness parameter
3.1.2. Constructing Negative-Class Sample Feature Set
- Step 1:
- construct the hypersphere neighborhood discriminated functions of M points by Equation (7)
- Step 2:
- for each point , can derive 2N points .
- Step 3:
- check if each constructed point is in . Then the set of all points, which are not in any , is the negative sample feature set.
3.1.3. Algorithm of Negative-Class Sample Segmentation Hypersphere
3.2. Probability Calibration
Algorithm 1: WTWD |
Input: training databases and label information , test sample Open-set threshold . 1. Optimization of compactness parameter by Equation (5). 2. Construct negative-class sample feature set by Equation (6). 3. Solve the negative-class sample segmentation hypersphere and compute decision scores of by Equations (24) and (25). 4. Compute the paired Weibull distribution corresponding to each category,get location parameter, shape parameter, and scale parameter of Weibull distribution and reverse Weibull distribution respectively, . 5. Input test sample, , use to calculate decision scores for each category. Calculate probability of Weibull distribution and probability of reverse Weibull distribution for each category. , , . belongs to UUCs. 6. Output: classification result of test sample |
4. Experiment and Discussion
4.1. Databases and Setting
4.2. Experiments and Results
4.2.1. Experiments on the Letter Recognition Open Dataset
4.2.2. Experiments on Caltech256 Open Dataset
4.2.3. Experiments on CIFAR100 Open Dataset
5. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
References
- Geng, C.; Huang, S.; Chen, S. Recent advances in open set recognition: A survey. IEEE Trans. Pattern Anal. Mach. Intell. 2020, 43, 3614–3631. [Google Scholar] [CrossRef] [Green Version]
- Dubuisson, B.; Masson, M. A statistical decision rule with incomplete knowledge about classes. Pattern Recognit. 1993, 26, 155–165. [Google Scholar] [CrossRef]
- Muzzolini, R.; Yang, Y.H.; Pierson, R. Classifier design with incomplete knowledge. Pattern Recognit. 1998, 31, 345–369. [Google Scholar] [CrossRef]
- Moeini, A.; Faez, K.; Moeini, H.; Safai, A.M. Open-set face recognition across look-alike faces in real-world scenarios. Image Vis. Comput. 2017, 57, 1–14. [Google Scholar] [CrossRef]
- Tax, D.M.J.; Duin, R.P.W. Support vector data description. Mach. Learn. 2004, 54, 45–66. [Google Scholar] [CrossRef] [Green Version]
- Schölkopf, B.; Platt, J.C.; Shawe-Taylor, J.; Smola, A.J.; Williamson, R.C. Estimating the support of a high-dimensional distribution. Neural Comput. 2001, 13, 1443–1471. [Google Scholar] [CrossRef] [PubMed]
- Cortes, C.; DeSalvo, G.; Mohri, M. Learning with rejection. In Proceedings of the International Conference on Algorithmic Learning Theory, Bari, Italy, 19–21 October 2016; Springer: Cham, Switzerland, 2016; pp. 67–82. [Google Scholar]
- Mendes Júnior, P.R.; De Souza, R.M.; Werneck, R.O.; Stein, B.V.; Pazinato, D.V.; de Almeida, W.R.; Penatti, O.A.B.; Torres, R.d.; Rocha, A. Nearest neighbors distance ratio open-set classifier. Mach. Learn. 2017, 106, 359–386. [Google Scholar] [CrossRef] [Green Version]
- Wen, Y.; Zhang, K.; Li, Z.; Qiao, Y. A comprehensive study on center loss for deep face recognition. Int. J. Comput. Vis. 2019, 127, 668–683. [Google Scholar] [CrossRef]
- Rocha, A.; Goldenstein, S.K. Multiclass from Binary: Expanding One-Versus-All, One-Versus-One and ECOC-Based Approaches. IEEE Trans. Neural Netw. Learn. Syst. 2017, 25, 289–302. [Google Scholar] [CrossRef]
- Jain, L.P.; Scheirer, W.J.; Boult, T.E. Multi-class open set recognition using probability of inclusion. In Proceedings of the European Conference on Computer Vision, Zurich, Switzerland, 6–12 September 2014; Springer: Cham, Switzerland, 2014; pp. 393–409. [Google Scholar]
- Xu, Y.; Liu, C. A rough margin-based one class support vector machine. Neural Comput. Appl. 2013, 22, 1077–1084. [Google Scholar] [CrossRef]
- Yang, G.; Qi, S.; Yu, T.; Wan, M.; Yang, Z.; Zhan, T.; Zhang, F.; Lai, Z. SVDTWDD Method for High Correct Recognition Rate Classifier with Appropriate Rejection Recognition Regions. IEEE Access 2020, 8, 47914–47924. [Google Scholar] [CrossRef]
- Wu, M.; Ye, J. A Small Sphere and Large Margin Approach for Novelty Detection Using Training Data with Outliers. IEEE Trans. Pattern Anal. Mach. Intell. 2009, 31, 2088–2092. [Google Scholar] [PubMed]
- Kotz, S.; Nadarajah, S. Extreme Value Distributions: Theory and Applications; Imperial College Press: London, UK, 2000. [Google Scholar]
- Scheirer, W.J.; de Rezende Rocha, A.; Parris, J.; Boult, T.E. Learning for meta-recognition. IEEE Trans. Inf. Secur. 2012, 7, 1214–1224. [Google Scholar] [CrossRef]
- Scheirer, W.J.; Rocha, A.; Micheals, R.J.; Boult, T.E. Meta-recognition: The theory and practice of recognition score analysis. IEEE Trans. Pattern Anal. Mach. Intell. 2011, 33, 1689–1695. [Google Scholar] [CrossRef] [PubMed]
- Scheirer, W.J.; Jain, L.P.; Boult, T.E. Probability models for open set recognition. IEEE Trans. Pattern Anal. Mach. Intell. 2014, 36, 2317–2324. [Google Scholar] [CrossRef] [PubMed] [Green Version]
- Rudd, E.M.; Jain, L.P.; Scheirer, W.J.; Boult, T.E. The extreme value machine. IEEE Trans. Pattern Anal. Mach. Intell. 2017, 40, 762–768. [Google Scholar] [CrossRef] [PubMed]
- Ding, L.; Liao, S. An Approximate Approach to Automatic Kernel Selection. IEEE Trans. Cybern. 2016, 47, 554–565. [Google Scholar] [CrossRef]
- Xu, Y. Maximum Margin of Twin Spheres Support Vector Machine for Imbalanced Data Classification. IEEE Trans. Cybern. 2016, 47, 1540–1550. [Google Scholar] [CrossRef]
- Frey, P.W.; Slate, D.J. Letter recognition using Holland-style adaptive classifiers. Mach. Learn. 1991, 6, 161–182. [Google Scholar] [CrossRef] [Green Version]
- Griffin, G.; Holub, A.; Perona, P. Caltech-256 Object Category Dataset. Technical Report 7694; California Institute of Technology: Pasadena, CA, USA, 2007. [Google Scholar]
- Krizhevsky, A.; Hinton, G. Learning Multiple Layers of Features from Tiny Images. Technical Report TR-2009; University of Toronto: Toronto, ON, Canada, 2009. [Google Scholar]
- Júnior, P.R.M.; Boult, T.E.; Wainer, J.; Rocha, A. Open-set support vector machines. IEEE Trans. Syst. Man Cybern. Syst. 2021, 52, 3785–3798. [Google Scholar] [CrossRef]
- Scheirer, W.J.; de Rezende Rocha, A.; Sapkota, A.; Boult, T.E. Toward open set recognition. IEEE Trans. Pattern Anal. Mach. Intell. 2012, 35, 1757–1772. [Google Scholar] [CrossRef] [PubMed]
- He, K.; Zhang, X.; Ren, S.; Sun, J. Deep Residual Learning for Image Recognition. In Proceedings of the 2016 IEEE Conference on Computer Vision and Pattern Recognition, Las Vegas, NV, USA, 27–30 June 2016; IEEE: Washington, DC, USA, 2016; pp. 770–778. [Google Scholar]
- Shi, C.; Panoutsos, G.; Luo, B.; Liu, H.; Li, B.; Lin, X. Using Multiple-Feature-Spaces-Based Deep Learning for Tool Condition Monitoring in Ultraprecision Manufacturing. IEEE Trans. Ind. Electron. 2018, 66, 3794–3803. [Google Scholar] [CrossRef]
- Scheirer, W.J.; Kumar, N.; Belhumeur, P.N.; Boult, T.E. Multi-attribute spaces: Calibration for attribute fusion and similarity search. In Proceedings of the 2012 IEEE Conference on Computer Vision and Pattern Recognition, Providence, RI, USA, 16–21 June 2012; IEEE: Washington, DC, USA, 2012; pp. 2933–2940. [Google Scholar]
Category | Airplane | Horse | Bird | Cat | Deer | Ship | Frog |
---|---|---|---|---|---|---|---|
Algorithm | |||||||
SVDD | 31.46% | 31.23% | 30.55% | 30.79% | 33.43% | 32.46% | 31.94% |
WSVM | 37.95% | 37.48% | 39.46% | 37.42% | 37.53% | 37.12% | 37.49% |
EVM | 28.87% | 26.74% | 28.19% | 27.31% | 29.47% | 27.53% | 25.79% |
ResNet18 | 34.93% | 35.42% | 35.38% | 35.16% | 35.79% | 37.34% | 34.82% |
OSSVM | 39.40% | 38.18% | 38.54% | 40.72% | 37.43% | 41.85% | 40.51% |
Our approach | 44.13% | 43.49% | 43.66% | 43.50% | 43.56% | 43.58% | 43.73% |
Publisher’s Note: MDPI stays neutral with regard to jurisdictional claims in published maps and institutional affiliations. |
© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
Share and Cite
Yang, G.; Zhou, S.; Wan, M. Open-Set Recognition Model Based on Negative-Class Sample Feature Enhancement Learning Algorithm. Mathematics 2022, 10, 4725. https://doi.org/10.3390/math10244725
Yang G, Zhou S, Wan M. Open-Set Recognition Model Based on Negative-Class Sample Feature Enhancement Learning Algorithm. Mathematics. 2022; 10(24):4725. https://doi.org/10.3390/math10244725
Chicago/Turabian StyleYang, Guowei, Shijie Zhou, and Minghua Wan. 2022. "Open-Set Recognition Model Based on Negative-Class Sample Feature Enhancement Learning Algorithm" Mathematics 10, no. 24: 4725. https://doi.org/10.3390/math10244725
APA StyleYang, G., Zhou, S., & Wan, M. (2022). Open-Set Recognition Model Based on Negative-Class Sample Feature Enhancement Learning Algorithm. Mathematics, 10(24), 4725. https://doi.org/10.3390/math10244725