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Fringe Projection Profilometry for Fast and Accurate 3D Surface Analysis

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".

Deadline for manuscript submissions: closed (31 December 2019) | Viewed by 2731

Special Issue Editors


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Guest Editor
Department of Civil and Industrial Engineering, University of Pisa, Pisa, Italy
Interests: 3D scanning; reverse engineering; image processing; 3D medical imaging; computer aided engineering; design for additive manufacturing

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Guest Editor
Department of Civil and Industrial Engineering, University of Pisa, Pisa, Italy
Interests: reverse engineering based on structured light-based sensing; image processing; 3D modelling processes for biomedical applications

Special Issue Information

Dear Colleagues,

The retrieval of reliable 3D surface information has become one of the most attractive research areas within optical metrology. 3D shape measurement techniques are used in a wide range of application fields, such as industrial engineering, design, manufacturing and inspection, virtual and augmented reality applications, cultural heritage, computer vision, and biomedical engineering.

Fringe projection profilometry (FPP) is a very popular noncontact 3D surface measurement technique where the information about the physical quantity to be measured is stored in the phase of a fringe pattern. The outstanding features of FPP rely on its ability to provide automatic, accurate, high-resolution, full-field 3D surface information. The different methods for phase estimation can be broadly classified into two categories: Phase-shifting methods, which require multiple fringe patterns, and spatial methods, which are based on a single fringe pattern. In this regard, single-shot methods are particularly suitable for real-time measurements, which play an important role in manufacturing inspection and dynamic 3D shape measurements. All these approaches have different advantages and drawbacks with respect to typical optical error sources. Even if several approaches have been proposed in the last years, 3D surface analysis in real scenarios is still affected by many problems, due to a variety of global illumination effects (high reflectivity, inter-reflections, surface scattering, etc.). These effects may introduce systematic and often significant errors in recovered shapes. For these reasons, FPP is still an active research field for the scientific community.

The Special Issue of the journal Applied Sciences “Fringe Projection Profilometry for Fast and Accurate 3D Surface Analysis” aims to cover recent advances in the development and use of FPP techniques for shape measurement processes in all the application fields. Authors are invited to contribute with both reviews and original research papers on the matter. Reviews papers should provide an up-to-date overview of the current state-of-the-art in a specific application and include main findings from several research groups.

Prof. Dr. Armando V. Razionale
Prof. Alessandro Paoli
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Fringe projection profilometry
  • Phase shifting
  • Structured light sensing
  • 3D shape measurement
  • 3D imaging
  • Phase unwrapping
  • 3D surface analysis
  • Camera calibration
  • Optical metrology

Published Papers (1 paper)

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Research

12 pages, 4392 KiB  
Article
A Radial-In-Plane Sensitivity Interferometer with Divergent Illumination for Displacement Measurement
by Jorge R. Parra-Michel, David Gutiérrez-Hernández, Rafael Martínez-Peláez and Marco A. Escobar
Appl. Sci. 2020, 10(3), 908; https://doi.org/10.3390/app10030908 - 30 Jan 2020
Cited by 1 | Viewed by 2402
Abstract
An in-plane radial sensitivity interferometer that uses the divergent illumination for displacement measurement in the radial direction is presented. A description and mathematical model for calculating the sensitivity vector are also presented. The interferometer has two polarizing filters: a circular one and a [...] Read more.
An in-plane radial sensitivity interferometer that uses the divergent illumination for displacement measurement in the radial direction is presented. A description and mathematical model for calculating the sensitivity vector are also presented. The interferometer has two polarizing filters: a circular one and a linear one to implement the phase stepping technique. A measurement of the radial deformation by thermal expansion is performed over an aluminium plate in order to test the interferometer. The results indicate that the maximum contribution of the out-of-plane with respect to the radial-in-plane sensitivity vector is less than 3% and decreases by less than 1% when measurements are performed near the optical axis. The measurement is compared with the results obtained by a finite element analysis on a virtual specimen model. Full article
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