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Applied Sciences
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X-ray Technologies for Chemical and Material Applications
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X-ray Technologies for Chemical and Material Applications

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Materials Science and Engineering".

Deadline for manuscript submissions: closed (15 January 2022) | Viewed by 8712

Special Issue Editors

Dr. Yohei Uemura

E-Mail Website
Guest Editor
FXE Beamline, European XFEL, 22869 Schenefeld, Germany
Interests: heterogeneous catalysts; semiconductors; time-resolved spectroscopy
Dr. Kiyofumi Nitta

E-Mail Website
Guest Editor
Japan Synchrotron Radiation Research Institute, SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
Interests: X-ray micro-spectroscopy; functional materials
Prof. Dr. Hiroki Wadati

E-Mail Website
Guest Editor
Graduate School of Material Science, University of Hyogo, 3-2-1 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan
Interests: strongly correlated materials; magnetic materials; ultrafast x-ray spectroscopy

Special Issue Information

Dear Colleagues,

X-rays are widely utilised in materials research as a basic characterisation tool to determine the atomic coordination or electronic properties of materials. It is possible to monitor dynamic changes in chemical systems or materials (i.e., in situ/operando measurements) using synchrotron facilities (SRs). Recent developments in 3rd/4th-generation SRs and X-ray free electron lasers (XFELs) have brought new opportunities to observe/characterise a tiny part of materials or address heterogeneities inside substances on a small scale (i.e., micrometre or nanometre) by focusing X-rays.

This Special Issue of the journal Applied Sciences entitled “X-ray Technologies for Chemical and Material Applications” calls for research articles covering recent developments/progress in chemistry and materials research utilising X-ray techniques. Research utilising advanced X-ray methodologies should be a main topic. However, research related to the development of new X-ray techniques/instruments or state-of-the-art techniques are very welcome. This Special Issue is intended to be a showcase for recent progress on applications of advanced X-ray techniques.

Dr. Yohei Uemura
Dr. Kiyofumi Nitta
Prof. Dr. Hiroki Wadati
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • time-resolved/spatially resolved X-ray techniques
  • in situ/operando measurements

Published Papers (3 papers)

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Research

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9 pages, 2325 KiB  
Article
Chemical State Mapping of p/n-Controlled SrB6 Bulk Specimens by Soft X-ray Emission Electron Microscope
by Masami Terauchi, Yohei K. Sato and Masatoshi Takeda
Appl. Sci. 2021, 11(20), 9588; https://doi.org/10.3390/app11209588 - 14 Oct 2021
Cited by 3 | Viewed by 1267
Abstract
Elemental and chemical state maps of p/n-controlled SrB6 bulk specimens are presented by using a soft X-ray emission spectroscopy electron microscope. Those bulk specimens were obtained by sintering powder specimens, prepared by the molten-salt method with different compositions of initial materials. [...] Read more.
Elemental and chemical state maps of p/n-controlled SrB6 bulk specimens are presented by using a soft X-ray emission spectroscopy electron microscope. Those bulk specimens were obtained by sintering powder specimens, prepared by the molten-salt method with different compositions of initial materials. A Sr-map, a chemical shift map of B K-emission, and the spectra of characteristic regions of those materials were compared. It was observed that a local Sr deficiency caused a local hole-doped region, confirmed by a chemical shift in the B K-emission spectrum. n-type SrB6 was rather homogeneous. On the other hand, the p-type SrB6 bulk specimen was a mixture of two different p-type regions. This mixed nature originated, presumably, from an uneven Sr content of SrB6 particles prepared by the molten-salt method using a Sr-deficient starting material. A separation process of the two types of materials will realize a high-quality homogeneous p-type SrB6 bulk specimens. Full article
(This article belongs to the Special Issue X-ray Technologies for Chemical and Material Applications)
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9 pages, 5239 KiB  
Article
Compton Scattering Imaging of Liquid Water in Porous Carbon-Based Materials
by Naruki Tsuji, Yoichiro Tsuji, Yoshiharu Uchimoto, Hideto Imai and Yoshiharu Sakurai
Appl. Sci. 2021, 11(9), 3851; https://doi.org/10.3390/app11093851 - 24 Apr 2021
Cited by 6 | Viewed by 3397
Abstract
Synchrotron-based Compton scattering imaging with intense high-energy X-rays allows the visualization of light element substances in an electrochemical device under an operando condition. In this study, we apply this imaging technique to a water-contained, porous carbon-based composite, which is used as a material [...] Read more.
Synchrotron-based Compton scattering imaging with intense high-energy X-rays allows the visualization of light element substances in an electrochemical device under an operando condition. In this study, we apply this imaging technique to a water-contained, porous carbon-based composite, which is used as a material for the gas diffusion layer in polymer electrolyte fuel cells. Analyses of the two-dimensional intensity images of Compton scattered X-rays provide the cross-sectional distributions of liquid water, as well as the depth dependency of the water content. In addition, the analyses reveal a significant interaction between the carbon materials and water droplets. Full article
(This article belongs to the Special Issue X-ray Technologies for Chemical and Material Applications)
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Review

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16 pages, 2045 KiB  
Review
Exploring Frontiers of 4D X-ray Tomography
by Wataru Yashiro, Wolfgang Voegeli and Hiroyuki Kudo
Appl. Sci. 2021, 11(19), 8868; https://doi.org/10.3390/app11198868 - 23 Sep 2021
Cited by 12 | Viewed by 3059
Abstract
In the 4D world of three-dimensional (3D) space plus time that we live in, there is a vast blue ocean in the spatio-temporal domain of micrometers and milliseconds that has never been accessed even with the most advanced measurement technology, and it is [...] Read more.
In the 4D world of three-dimensional (3D) space plus time that we live in, there is a vast blue ocean in the spatio-temporal domain of micrometers and milliseconds that has never been accessed even with the most advanced measurement technology, and it is expected to be full of various non-equilibrium phenomena. In this paper, we review recent advances in synchrotron hard X-ray tomography we have made that can be used to explore the 4D frontier. Full article
(This article belongs to the Special Issue X-ray Technologies for Chemical and Material Applications)
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