Intelligent Diagnostic and Prognostic Methods for Electronic Systems and Mechanical Systems
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Mechanical Engineering".
Deadline for manuscript submissions: closed (25 July 2022) | Viewed by 25432
Special Issue Editors
Interests: automatic test; diagnosis; prognosis; testability methods for circuits and systems
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The scale of modern electronic systems or mechanical systems is becoming more complex, but the testable parameters are becoming less, which makes it difficult to locate the fault, and thus, the diagnosis cost is high. This Special Issue calls for papers on the fault diagnosis and prediction technology of complex electronic and mechanical systems such as analog circuits, lithium batteries, and gears, including but not limited to fault feature extraction, diagnostic reasoning methods, performance degradation, life prediction, etc.
Prof. Dr. Bing Long
Prof. Dr. Zhen Liu
Guest Editors
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Keywords
- fault diagnosis
- diagnostics
- diagnostic reasoning
- fault feature extraction
- prognostics
- performance degradation
- life prediction
- residual useful life (RUL)
- analog circuits
- lithium-ion battery
- gears system
- data-driven methods
- model-based methods
- machine learning
- neural network
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