Search for Articles:
Title / Keyword
Author / Affiliation / Email
Journal
Article Type
 
 
Advanced Search
 
Section
Special Issue
Volume
Issue
Number
Page
 
4.7
3.4
Journals
Micromachines
Special Issues
Nanoscale Materials and Measurements
share announcement

Nanoscale Materials and Measurements

A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "D：Materials and Processing".

Deadline for manuscript submissions: closed (31 December 2023) | Viewed by 3286

Special Issue Editors

Prof. Dr. Jayne C. Garno

E-Mail Website
Guest Editor
Chemistry Department, Louisiana State University, 232 Choppin Hall, Baton Rouge, LA 70803, USA
Interests: SPM; AFM; photocurrents; magnetic nanomaterials; surface science; self-assembled monolayers; nanolithography
Special Issues, Collections and Topics in MDPI journals
Dr. Susan Verberne-Sutton

E-Mail Website
Guest Editor
Department of Chemistry, Vanderbilt University, Nashville, TN 37235, USA
Interests: scanning probe microscopy

Special Issue Information

Dear Colleagues,

Studies in all areas of nanoscience are transforming our understanding of materials and their associated properties. Nanoscience measurements can be applied to probe the chemistry and properties of molecular systems at surfaces and interfaces to disclose new information and details at the smallest of size scales. This Special Issue will include contributions that encompass recent advancements and studies of nanoscale materials, such as experiments using modes of scanning probe microscopy and nanolithography. The topics to be included are innovations in nanoscale measurements, computational studies of molecular systems, nanolithography, as well as designing the chemistry of nanoparticles to achieve multiple functional properties. The size and composition of molecular assemblies and hybrid nanoparticles can be selected to correspondingly tailor the optical, magnetic and electronic properties of the designed materials. Nanoparticles comprised of hybrid materials such as polymers, organic films and biomolecules have useful properties for medicine or for commercial applications. Research advances with nanolithography provide toolkits for preparing surface structures with well-defined geometries. This Special Issue seeks research papers and review articles of innovative studies about nanoscale materials and measurements with applications that span multiple disciplines. The Special Issue will also showcase proceedings from the Symposium in Transformational Nanoscience held at the 2022 ACS Southwest Regional Meeting.

Prof. Dr. Jayne C. Garno
Dr. Susan Verberne-Sutton
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Micromachines is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • Scanning Probe Microscopy (SPM)
  • nanoscience
  • surface science
  • nanomaterials, organic films and polymers
  • nanofabrication
  • self-assembled monolayers

Published Papers (2 papers)

Download All Papers
Order results
Result details
Show export options expand_more Show export options expand_less
Select all
Export citation of selected articles as:

Research

18 pages, 12835 KiB  
Article
Correction of Rotational Eccentricity Based on Model and Microvision in the Wire-Traction Micromanipulation System
by Yuezong Wang, Daoduo Qu, Shengyi Wang, Jiqiang Chen and Lina Qiu
Micromachines 2023, 14(5), 963; https://doi.org/10.3390/mi14050963 - 28 Apr 2023
Cited by 2 | Viewed by 1118
Abstract
In the realm of automatic wire-traction micromanipulation systems, the alignment of the central axis of the coil with the rotation axis of the rotary stage can be a challenge, which leads to the occurrence of eccentricity during rotation. The wire-traction is conducted at [...] Read more.
In the realm of automatic wire-traction micromanipulation systems, the alignment of the central axis of the coil with the rotation axis of the rotary stage can be a challenge, which leads to the occurrence of eccentricity during rotation. The wire-traction is conducted at a micron-level of manipulation precision on micron electrode wires; eccentricity has a significant impact on the control accuracy of the system. To resolve the problem, a method for measuring and correcting the coil eccentricity is proposed in this paper. First, models of radial and tilt eccentricity are established respectively based on the eccentricity sources. Then, measuring eccentricity is proposed by an eccentricity model and microscopic vision; the model is used to predict eccentricity, and visual image processing algorithms are used to calibrate model parameters. In addition, a correction based on the compensation model and hardware is designed to compensate for the eccentricity. The experimental results demonstrate the accuracy of the models in predicting eccentricity and the effectiveness of correction. The results show that the models have an accurate prediction for eccentricity that relies on the evaluation of the root mean square error (RMSE); the maximal residual error after correction was within 6 μm, and the compensation was approximately 99.6%. The proposed method, which combines the eccentricity model and microvision for measuring and correcting eccentricity, offers improved wire-traction micromanipulation accuracy, enhanced efficiency, and an integrated system. It has more suitable and wider applications in the field of micromanipulation and microassembly. Full article
(This article belongs to the Special Issue Nanoscale Materials and Measurements)
►▼ Show Figures

Figure 1

16 pages, 8487 KiB  
Article
Measurement and Control System for Atomic Force Microscope Based on Quartz Tuning Fork Self-Induction Probe
by Yongzhen Luo, Xidong Ding, Tianci Chen, Tao Su and Dihu Chen
Micromachines 2023, 14(1), 227; https://doi.org/10.3390/mi14010227 - 15 Jan 2023
Viewed by 1826
Abstract
In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe [...] Read more.
In this paper, we introduce a low-cost, expansible, and compatible measurement and control system for atomic force microscopes (AFM) based on a quartz tuning fork (QTF) self-sensing probe and frequency modulation, which is mainly composed of an embedded control system and a probe system. The embedded control system is based on a dual-core OMAPL138 microprocessor (DSP + ARM) equipped with 16 channels of a 16-bit high-precision general analog-to-digital converter (ADC) and a 16-bit high-precision general digital-to-analog converter (DAC), six channels of an analog-to-digital converter with a second-order anti-aliasing filter, four channels of a direct digital frequency synthesizer (DDS), a digital input and output (DIO) interface, and other peripherals. The uniqueness of the system hardware lies in the design of a high-precision and low-noise digital—analog hybrid lock-in amplifier (LIA), which is used to detect and track the frequency and phase of the QTF probe response signal. In terms of the system software, a software difference frequency detection method based on a digital signal processor (DSP) is implemented to detect the frequency change caused by the force gradient between the tip and the sample, and the relative error of frequency measurement is less than 3%. For the probe system, a self-sensing probe controller, including an automatic gain control (AGC) self-excitation circuit, is designed for a homemade balanced QTF self-sensing probe with a high quality factor (Q value) in an atmospheric environment. We measured the quality factor (Q value) of the balanced QTF self-sensing probes with different lengths of tungsten tips and successfully realized AFM topography imaging with a tungsten-tip QTF probe 3 mm in length. The results show that the QTF-based self-sensing probe and the developed AFM measurement and control system can obtain high quality surface topography scanning images in an atmospheric environment. Full article
(This article belongs to the Special Issue Nanoscale Materials and Measurements)
►▼ Show Figures

Figure 1

Show export options expand_more Show export options expand_less
Select all
Export citation of selected articles as:
 
Displaying articles 1-2
Back to TopTop