Advances in GaN- and SiC-Based Electronics: Design and Applications
A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "D:Materials and Processing".
Deadline for manuscript submissions: 30 November 2024 | Viewed by 2470
Special Issue Editor
2. Chengdu University of Information Technology, Chengdu 610225, China
Interests: semiconductor materials and power devices; power integrated circuits
Special Issue Information
Dear Colleagues,
The RF and power electronics industry promote the development of the world’s economy, facilitate highly efficient utilization of energy, and allow convenience in daily life. As the typical representative of wide-bandgap technology, GaN- and SiC-based electronic devices contribute to high-efficiency power conversion and advanced, high-efficiency RF communication systems. To support the expanding markets for electric/ hybrid cars, datacenters, renewable energy generation and conversion, and smart grids, GaN- and SiC-based power devices are required for higher power densities, higher breakdown voltages, and lower losses. The challenge of 5G and future 6G networks requires GaN RF devices with high fT, fmax and high efficiency.
Both challenges can be addressed through the development of advanced GaN- and SiC-based electronics, relying on overall optimization from materials, manufacturing technology, device design, and application development. Despite the impressive developments in the past decade, there are still several scientific issues that need to be addressed in order to overcome the limits of GaN and SiC materials. Some issues include the following: (1) the development of low-defect growth methods; (2) advanced device structure optimization for high performance; (3) the optimization of device processing and passivation, with the aim of maximizing device performance; (4) advanced methodologies for driving and thermal management; (5) application-driven integration on both circuit and system levels; (6) reliability analysis and reliability-enhanced technology.
We look forward to receiving your submissions.
Prof. Dr. Xiaorong Luo
Guest Editor
Prof. Dr. Xiaorong Luo
Guest Editor
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Keywords
- advanced material structures, growth and characterization
- power devices
- RF devices
- advanced device manufacturing process
- integration design
- module technology
- reliability
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