Metrological Traceability
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: 31 May 2025 | Viewed by 162
Special Issue Editor
Special Issue Information
Dear Colleagues,
Metrologically traceable measurements are essential when important societal decisions are based on physical data. The rigor provided by traceable measurement is crucial for making robust, reliable, trustworthy decisions. But what exactly is traceable measurement, and how can it be represented in digital form? These questions now concern many people working towards the digital transformation of measurement infrastructures.
A recent workshop stimulated discussion on this important topic. Organized by the CIPM Forum on Metrology and Digitalization, in partnership with several technical committees of IMEKO, the workshop examined traceability in today’s measurement infrastructure, which is built on principles established in the late 20th century. The workshop also explored traceability for new and emerging measurement system technologies, including intrinsic standards, sensor networks, virtual measuring systems, and virtual data spaces.
This Special Issue offers a platform for further and more detailed exchanges of ideas on these topics. Submissions are invited that shed light on the challenges posed by traceable measurement and its representation in the broader context of the digital transformation of the international measurement system.
Dr. Blair Hall
Guest Editor
Manuscript Submission Information
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Keywords
- metrological traceability
- measurement standard
- measurement uncertainty
- quality infrastructure
- calibration
- digitalization
- digital transformation
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