Special Issues

Metrology publishes Special Issues to create collections of papers on specific topics, with the aim of building a community of authors and readers to discuss the latest research and develop new ideas and research directions. Special Issues are led by Guest Editors, who are experts on the topic and all Special Issue submissions follow MDPI's standard editorial process. The journal’s Editor-in-Chief and/or designated Editorial Board Member will oversee Guest Editor appointments and Special Issue proposals, checking their content for relevance and ensuring the suitability of the material for the journal. The papers published in a Special Issue will be collected and displayed on a dedicated page of the journal’s website. Further information on MDPI's Special Issue polices and Guest Editor responsibilities can be found here. For any inquiries related to a Special Issue, please contact the Editorial Office.

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Developments in 3D Metrology Selected from the 3D Metrology Conference
edited by Stephen Kyle, Ben Hughes, and
submission deadline 30 Nov 2024 | 2 articles | Viewed by 4588 | Submission Open
Keywords: portable coordinate metrology (PCM); large-volume metrology (LVM); close-range photogrammetry; laser tracking; 3D surface inspection (from area scanning to detailed roughness); CMM technology advances; computed tomography (CT) for metrology applications; metrology-assisted manufacturing (e.g.; machining; assembly); robotic and automated PCM; point-cloud analysis; virtual metrology systems; metrology integration with digital twins; mixed robotic and human workspaces; multiple object tracking; 3D data analysis for quality maintenance
Next-Level Surface Metrology—Advances in Sensors, Data Analysis and Simulation submission deadline 25 Jan 2025 | 1 articles | Viewed by 1923 | Submission Open
Advancements in Optical Measurement Devices and Technologies
edited by and
submission deadline 25 Jan 2025 | Viewed by 111 | Submission Open
Keywords: optical sensors; fiber optic sensing; laser interferometry; spectroscopy; lidar; frequency comb; biophotonics; optical imaging; laser doppler velocimetry; environmental sensing; biomedical applications; precision metrology; measurement technologies
Advances in Laser Interferometry for Precision Engineering
edited by , and Pengcheng Hu
submission deadline 15 Feb 2025 | 3 articles | Viewed by 3470 | Submission Open
Keywords: key components or devices for laser interferometry; novel interferometric system for metrology; calibration and comparison system for interferometers; new applications of laser interferometry; special geometrical parameter measurement with interferometers
Advances in Optical 3D Metrology
edited by Giorgio Vassena, and
submission deadline 25 Jun 2025 | 1 articles | Viewed by 635 | Submission Open
Keywords: photogrammetry; active sensors; sensor calibration; bundle adjustment; quality control; accuracy
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