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Insights Around the Quality of Metrology Revealed by Roughness Parameters
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Advancing Molecular Spectroscopy Efficiency with Extensive Parallelism
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Evaluation of Image Segmentation Methods for In Situ Quality Assessment in Additive Manufacturing
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SurfILE: An Open-Source Python Package for Surface Topography Analysis
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Differential Hall Effect Metrology for Electrical Characterization of Advanced Semiconductor Layers
Journal Description
Metrology
- Open Access— free for readers, with article processing charges (APC) paid by authors or their institutions.
- High Visibility: indexed within ESCI (Web of Science), Scopus and other databases.
- Rapid Publication: manuscripts are peer-reviewed and a first decision is provided to authors approximately 33.5 days after submission; acceptance to publication is undertaken in 3.3 days (median values for papers published in this journal in the second half of 2024).
- Recognition of Reviewers: APC discount vouchers, optional signed peer review, and reviewer names published annually in the journal.
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