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Advances in Optical 3D Metrology
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Advances in Optical 3D Metrology

A special issue of Metrology (ISSN 2673-8244).

Deadline for manuscript submissions: 25 June 2025 | Viewed by 1716

Special Issue Editors

Dr. Giorgio Vassena

E-Mail Website
Guest Editor
Department of Civil, Environmental, Architectural, Engineering and Mathematics, University of Brescia, Via Branze 43, 25123 Brescia, Italy
Interests: mobile mapping; laser scanner; 3D; deformation monitoring of large structures and infrastructures; cultural heritage survey
Prof. Dr. Fabio Remondino

E-Mail Website
Guest Editor
3D Optical Metrology (3DOM) Unit, Bruno Kessler Foundation (FBK), 38123 Trento, Italy
Interests: geomatics; mapping; UAV
Special Issues, Collections and Topics in MDPI journals
Prof. Dr. Mark Shortis

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Guest Editor
School of Science, RMIT University, GPO Box 2476, Melbourne 3001, Australia
Interests: close range photogrammetry applications; precise optical metrology; camera calibration
Special Issues, Collections and Topics in MDPI journals

Special Issue Information

Dear Colleagues,

The topic of Optical 3D Metrology (O3DM) tackles precise 3D measurements and accurate modelling from imaging and range sensors. Research on Optical 3D Metrology investigates open issues concerning detailed 3D reconstructions in fields including industrial inspections, aerospace and automotive design, material and component testing, scene documentation, motion analysis, medical applications, and the exploration of remote and hazardous sites, to name but a few examples.

This Special Issue stems from the ISPRS Optical 3D Metrology workshop (https://o3dm.fbk.eu), which involves a series of biannual conferences that build upon the heritage of SPIE Videometrics (1991–2017) and Optical 3D Measurement Techniques (1989–2009). The two previous editions of this O3DM workshop were held in Strasbourg (France) in December 2019 and in Wuerzburg (Germany) in December 2022.

Topics of interest include, but are not limited to, the following:

  • optical sensor investigations and characterisation;
  • radiometric and geometric calibration of sensors;
  • sensor/data fusion;
  • the quality and calibration of colour for 3D models acquired using optical and range-sensing techniques;
  • algorithms for precise 3D data derivation and processing;
  • ambiguous sequences in image orientation;
  • hybrid adjustments for high-accuracy applications;
  • AI methods in metrology and industrial inspections;
  • the handling of transparent or reflective surfaces.

For this Special Issue, we are seeking innovative contributions in the form of extended and improved versions of the articles that were presented at the aforementioned workshops. The accepted papers will be published as peer-reviewed articles in Metrology.

Dr. Giorgio Vassena
Prof. Dr. Fabio Remondino
Prof. Dr. Mark Shortis
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • photogrammetry
  • active sensors
  • sensor calibration
  • bundle adjustment
  • quality control
  • accuracy

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Further information on MDPI's Special Issue polices can be found here.

Published Papers (2 papers)

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Research

35 pages, 14662 KiB  
Article
A Statistical Approach for Characterizing the Behaviour of Roughness Parameters Measured by a Multi-Physics Instrument on Ground Surface Topographies: Four Novel Indicators
by Clément Moreau, Julie Lemesle, David Páez Margarit, François Blateyron and Maxence Bigerelle
Metrology 2024, 4(4), 640-672; https://doi.org/10.3390/metrology4040039 - 18 Nov 2024
Viewed by 197
Abstract
With a view to improve measurements, this paper presents a statistical approach for characterizing the behaviour of roughness parameters based on measurements performed on ground surface topographies (grit #080/#120). A S neoxTM (Sensofar®, Terrassa, Spain), equipped with three optical instrument [...] Read more.
With a view to improve measurements, this paper presents a statistical approach for characterizing the behaviour of roughness parameters based on measurements performed on ground surface topographies (grit #080/#120). A S neoxTM (Sensofar®, Terrassa, Spain), equipped with three optical instrument modes (Focus Variation (FV), Coherence Scanning Interferometry (CSI), and Confocal Microscopy (CM)), is used according to a specific measurement plan, called Morphomeca Monitoring, including topography representativeness and several time-based measurements. Previously applied to the Sa parameter, the statistical approach based here solely on the Quality Index (QI) has now been extended to a multi-parameter approach. Firstly, the study focuses on detecting and explaining parameter disturbances in raw data by identifying and quantifying outliers of the parameter’s values, as a new first indicator. This allows us to draw parallels between these outliers and the surface topography, providing reflection tracks. Secondly, the statistical approach is applied to highlight disturbed parameters concerning the instrument mode used and the concerned grit level with two other indicators computed from QI, named homogeneity and number of modes. The applied method shows that a cleaning of the data containing the parameters values is necessary to remove outlier values, and a set of roughness parameters could be determined according to the assessment of the indicators. The final aim is to provide a set of parameters which best describe the measurement conditions based on monitoring data, statistical indexes, and surface topographies. It is shown that the parameters Sal, Sz and Sci are the most reliable roughness parameters, unlike Sdq and S5p, which appear as the most unstable parameters. More globally, the volume roughness parameters appear as the most stable, differing from the form parameters. This investigated point of view offers thus a complementary framework for improving measurement processes. In addition, this method aims to provide a global and more generalizable alternative than traditional methods of uncertainty calculation, based on a thorough analysis of multi-parameter and statistical indexes. Full article
(This article belongs to the Special Issue Advances in Optical 3D Metrology)
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13 pages, 9589 KiB  
Article
Metrological Analysis with Covariance Features of Micro-Channels Fabricated with a Femtosecond Laser
by Matteo Verdi, Federico Bassi, Luigi Calabrese, Martina Azzolini, Salim Malek, Roberto Battisti, Eleonora Grilli, Fabio Menna, Enrico Gallus and Fabio Remondino
Metrology 2024, 4(3), 398-410; https://doi.org/10.3390/metrology4030024 - 1 Aug 2024
Viewed by 933
Abstract
This study presents an automated methodology for evaluating micro-channels fabricated using a femtosecond laser on stainless steel substrates. We utilize 3D surface topography and metrological analyses to extract geometric features and detect fabrication defects. Standardized samples were analyzed using a light interferometer, and [...] Read more.
This study presents an automated methodology for evaluating micro-channels fabricated using a femtosecond laser on stainless steel substrates. We utilize 3D surface topography and metrological analyses to extract geometric features and detect fabrication defects. Standardized samples were analyzed using a light interferometer, and the resulting data were processed with Principal Component Analysis (PCA) and RANSAC algorithms to derive channel characteristics, such as depth, wall taper, and surface roughness. The proposed method identifies common defects, including bumps and V-defects, which can compromise the functionality of micro-channels. The effectiveness of the approach is validated by comparisons with commercial solutions. This automated procedure aims to enhance the reliability and precision of femtosecond laser micro-milling for industrial applications. The detected defects, combined with fabrication parameters, could be ingested in an AI-based process to optimize fabrication processes. Full article
(This article belongs to the Special Issue Advances in Optical 3D Metrology)
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